Olympus Corporation

The Institute of Physical and Chemical Research

Riken Corporation

Takashi Fukano

Atsushi Miyawaki

Yasushi Aono

Yoshihiro Kawano

Keiji Shimizu

Ichirou Yamaguchi

An illumination apparatus for a microscope includes a light source portion that projects a light beam, two splitting elements that split the light beam into three, wavelength selection elements that independently select transmission wavelengths of the three light beams, shutters that independently shield or guide the three light beams, a first combining element that combines optical paths of two light beams, a second combining element that combines an optical path of the remaining light beam with a combined optical path, a pinhole that is located on an optical path between the first and second combining elements and has an aperture that selectively transmits only part of a light beam, and a projection optical system that applies a light beam from the second combining element to a sample and, when applying a light beam from the pinhole to the sample, projects the aperture of the pinhole onto the sample.

Illumination apparatus for microscope

A microscope system comprises: a control means () capable of generating electric control signals (); a spatial modulator means () having an illuminated surface () to be illuminated by light emitted by a light source (), and capable of receiving the electric control signal and of spatially modulating reflection characteristic or transmission characteristic of the illuminated surface by a spatial frequency specified by the electric control signal; an illuminating optical means () for illuminating a specimen () with light spatially modulated by the spatial modulator means; an image detecting means () for detecting a signal image formed by signal light emitted by the specimen illuminated by the illuminating optical means; and an arithmetic means () for processing signal images formed by using the spatial frequency of at least three different phases set by the control means and detected by the image detecting means to obtain an optical sectioned image.

Microscope system

An illumination apparatus for a microscope and an image processing apparatus using the illumination apparatus include a light source, a semi-transmissive mirror splitting a light beam from the light source into two beams of the first and second irradiation light, two excitation filters selecting the wavelengths of the first and second irradiation light, a semi-transmissive mirror synthesizing individual beams of the first and second irradiation light whose wavelengths are selected, into a single beam, a dichroic mirror directing a light beam synthesized by the semi-transmissive mirror toward a specimen and transmitting light from the specimen, an objective lens, cameras imaging fluorescent light from the specimen after being separated into fluorescent light excited by the first and second wavelengths, and an image processing section processing fluorescent images formed by imaging elements.

Illumination apparatus for microscope and image processing apparatus using the same

An illumination system for microscopy includes a light source, a first spectral element dispersing light from the light source, a reflecting member selectively reflecting light dispersed by the first spectral element, a second spectral element combining light reflected by the reflecting member, a dichroic mirror, an objective lens, and an image sensor. The first spectral element is placed at the front focal point of a first lens, the reflecting member is placed at a position where the back focal point of the first lens coincides with the front focal point of a second lens, and the second spectral element is placed at the back focal point of the second lens.

Illumination system for microscopy and observation or measuring method using the same

A light beam emitted by a light source is projected through a collimator lens, a beam splitter and an objective on a sample having a laminated structure. The light beam reflected from the sample travels through the beam splitter to a detector and the detector provides a confocal signal. The detector provides an interference signal upon the reception of the reflected light beam and a reference light beam reflected by a reference mirror. The sample and the reference mirror are moved on the basis of the confocal signal and the interference signal, and the thickness and the refractive index of layer of the sample are determined on the basis of the respective displacements of the sample and the reference mirror.

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Wako, Japan

Takashi Fukano