Kabushiki Kaisha Toshiba

Hitachi-high-technologies Corporation

Hitachi High-tech Corporation

Jfe Steel Corporation

Koganei Corporation

Toshiba Corporation

Nec Corporation

Honda Motor Co., Ltd.

Toshiba Tec Kabushiki Kaisha

Nippon Steel Corporation

Hitachi Maxell, Limited

Jsr Corporation

Hitachi Consumer Electronics Co., Ltd.

Toshiba Lifestyle Products & Services Corporation

Hisense Visual Technology Co., Ltd.

Takashi Doi

Nobuaki Suzuki

Soichiro Matsunaga

Souichi Katagiri

Noriaki Arai

Keigo Kasuya

Hideo Todokoro

Makoto Ezumi

Masahiko Mawatari

Masaaki Ogawa

Ryoichi Ishii

Masato Tago

Yoshio Kataoka

Shinji Koseki

Yuji Kasai

Kazuyuki Kashima

Akihiro Noguchi

Hideki Miyasato

Teruhiko Tobe

Mitsugu Sato

Hajime Kawano

Yoichi Ose

Koji Kashima

Takashi Minemura

Kenji Tanimoto

Tsutomu Sakuma

Shoji Kasai

Shuhei Ishikawa

Shinichiro Hamada

Naoki Homma

Nobuaki Kabuto

Hiroyuki Ito

Hidetoshi Morokuma

Minoru Yamazaki

Yuko Sasaki

Fumihiro Sasajima

Hideki Ohkita

Toshihiko Kitamura

Kenji Komori

Toshiaki Tanaka

Kenji Kobayashi

Maki Tanaka

Hiroshi Morita

Yasunari Sohda

Katsuhiko Hieda

Atsushi Miyamoto

Takashi Ohshima

Kenji Miyata

Yuki Suzuki

Tsutomu Shimokawa

Hideyuki Aisu

Takayuki Sakai

Makoto Sakakibara

Masahiro Fuda

Soshi Fujita

Kazuhiro Honda

Hiromi Suzuki

Ichiro Tomoda

Sho Takami

Yasushi Ebizuka

Atsuko Yamashita

Yoshihiro Kimura

Wataru Mori

Hiroyuki Kamio

Katsumi Setoguchi

Genichi Shigesato

Kazuki Akami

Masatoshi Murakami

Takumi Koyama

Yuzuru Mochizuki

Satoru Kamijo

Akinori Ohta

Shunichi Watanabe

Daigo Komesu

Akiyoshi Kato

Satoshi Ochiai

Aki Takei

Erina Kawamoto

Tetsuya Sawahata

Naoki Akimoto

Daiki Kodaira

Naomi Inatomi

Yusuke Sakai

Makoto Mizokami

Norio Tanahashi

Hideki Miyazato

Wataru Yamane

Tomoyuki Miura

Kazumi Tomioka

Masatoshi Nishide

Osamu Sato

Hiroto Kubo

Provided is a charged particle beam device that can precisely manage a temperature at which a cold field emitter is heated. A charged particle beam device includes: a cold field emitter including a tip having a sharpened distal end, a filament connected to the tip, and an auxiliary electrode covering the filament and having an opening from which the tip protrudes; an extraction electrode to which an extraction voltage for extracting electrons from the cold field emitter is applied; and an acceleration electrode to which an acceleration voltage for accelerating the electrons extracted from the cold field emitter is applied. When the tip and the filament are heated, thermionic electrons emitted from the tip and the filament are collected by the auxiliary electrode to measure a current by applying a positive voltage with respect to the tip to the auxiliary electrode.

Charged particle beam device

A straddle type vehicle includes a front detection unit configured to detect an object in front of a self-vehicle, a first determination unit configured to determine whether there is an avoidance space for avoiding contact with the object by turning in a case where there is a possibility of contact of the self-vehicle with the object, and a notification unit configured to give notification of information regarding the avoidance space in a case where the first determination unit determines that there is the avoidance space. The notification unit gives notification of information, as the information regarding the avoidance space, indicating that it is possible to avoid contact with the object by turning in a travel lane in which the self-vehicle is traveling.

Straddle type vehicle, method for controlling the same, control apparatus, and storage medium

A decelerating electrode of an energy filter includes an electrode pair that has an opening and a cavity portion provided in a rotationally symmetrical manner with the center of the opening as the optical axis. Voltages with electric potentials that are substantially the same as that of a charged particle beam are independently applied to both sides of the decelerating electrode. When an electrical field protrudes into the cavity portion, a saddle point having the same electric potential as that of incident charged particles is formed inside the decelerating electrode. The saddle point acts as a high pass filter for incident charged particles at an energy resolution ofmV or less. By analyzing charged particles which have been energy-separated, it is possible to measure the energy spectrum and ΔE at the high resolution ofmV or less and to obtain an SEM/STEM image with a high resolution.

Energy filter, and energy analyzer and charged particle beam device provided with same

A hot-stamped product with improved delayed-fracture resistance is provided. The hot-stamped productincludes: a steel substrate; and an Al filmformed on the steel substrate, the Al filmincluding: an interface layerlocated at the interface with the steel substrateand with part of the αFe substituted by Al and Si; an intermediate layerformed on the interface layer; and an oxide layer formed on the intermediate layer, the intermediate layerincluding an Fe—Al—Si phasewith part of the αFe substituted by Al and Si, the Fe—Al—Si phaseincluding one or more elements selected from the group consisting of Zr, Ce, Y, Ta, Ni, Cu, Nb, Cr, Co, V and Ti, the oxide layerincluding one or more elements selected from the group consisting of Be, Mg, Ca, Sr, Ba, Sc and Zn.

Hot-stamped product

A slit nozzle having a double-tube structure and a method for manufacturing a high-silicon steel strip having a small variation in Si concentration depending on the position in the width direction of the steel strip. The slit nozzle has a double-tube structure, in which a flow-control plate which closes a gap between an inner tube and an outer tube is disposed between an open end of the inner tube and an end of a delivery port, and in which an opening is formed in a plane in which the flow-control plate is disposed only in a range of the flow-control plate of 27.5° or more and 332.5° or less in terms of a central angle with respect to a reference line Lpassing through the axis of the outer tube and the central position in the width direction of the delivery port.

Slit nozzle and method for manufacturing high-silicon steel strip

In an electron source including a suppressor electrode having an opening at one end portion thereof in a direction along a central axis and an electron emission material having a distal end protruding from the opening, the suppressor electrode further includes a receding portion receding to a position farther from the distal end of the electron emission material than the opening in the direction along the central axis at a position in an outer peripheral direction than the opening, and at least a part of the receding portion is disposed within a diameter of 2810 μm from a center of the opening. Accordingly, an electron source, an electron gun, and a charged particle beam device such as an electron microscope using the same, in which a machine difference in a device performance due to an axial shift between the electron emission material and the suppressor electrode is reduced, are implemented.

Electron source, electron gun, and charged particle beam device

According to one embodiment, an image display system includes a source device, a sink device, and an HDMI cable that connects the source device and the sink device. The source device includes a transmitter configured to transmit a plurality of pieces of image data via the HDMI cable. The sink device includes a receiver configured to receive the transmitted plurality of pieces of image data, a storage configured to store the received plurality of pieces of image data, and a display controller configured to execute display control processing of repeatedly displaying the plurality of pieces of image data stored in the storage. The transmitter does not transmit image data while the display control processing is being executed.

Image display system and method

There is provided a charged particle beam system having a computer system for controlling an acceleration voltage of a charged particle beam emitted from a charged particle source, the system including: a first diaphragm group having first and second diaphragms which are diaphragms that act on the charged particle beam and have different thicknesses; and a first diaphragm switching mechanism for switching the diaphragm in the first diaphragm group, in which the computer system controls the first diaphragm switching mechanism so as to switch from the first diaphragm to the second diaphragm according to an increase or decrease of the acceleration voltage.

Charged particle beam system

According to one embodiment, a source device generates a multistream signal transmitted to a plurality of sink devices which are connected by daisy-chaining and generates the multistream signal by associating daisy chain stage numbers of the sink devices with contents streams for the sink devices.

Source device and sink device

The invention provides an electron beam apparatus that reduces a time required for an electron gun chamber to which a sputter ion pump and a non-evaporable getter pump are connected to reach an extreme high vacuum state. The electron beam apparatus includes an electron gun configured to emit an electron beam and the electron gun chamber to which the sputter ion pump and the non-evaporable getter pump are connected. The electron beam apparatus further includes a gas supply unit configured to supply at least one of hydrogen, oxygen, carbon monoxide, and carbon dioxide to the electron gun chamber.

Electron beam apparatus and method for controlling electron beam apparatus

An adapter device communicates with a sink device and a source device using first and second communication schemes, respectively. The adapter device includes: a transceiver receiving a state read request by detecting that a serial data line connected between the adapter device and the sink device is driven to a low level when a serial clock line connected therebetween is at a high level, and drive the serial data line to the low level and drive the serial clock line to a low level; a transmitter transmitting the state read request to the source device after the serial clock line is driven to the low level; and a receiver receiving a state read signal to read data of a state register in the sink device from the source device, wherein the transceiver transmits the state read signal to the sink device via the serial data line.

Adapter device and communication method

A bridle device and a method for producing a steel strip in which snaking of a steel strip that occurs during production of a high-silicon steel strip is suppressed. The bridle device includes a pair of upper and lower rotatable endless belts or a pair of upper and lower rotatable caterpillars configured to pinch a steel strip. The bridle device is movable or swingable in a steel strip width direction by using a steering mechanism. The bridle device further includes a rolling reduction mechanism configured to perform rolling reduction on a pinched portion of the steel strip by using the pair of upper and lower endless belts or the pair of upper and lower caterpillars. The steering mechanism moves or swings the bridle device in the steel strip width direction, and the rolling reduction mechanism performs rolling reduction on one of end portions in the steel strip width direction.

Bridle device, method for controlling snaking of steel strip, and method for producing steel strip

According to one embodiment, a signal transmission device AC-coupled with a reception device through a digital transmission line, includes transmitting circuitry configured to transmit a differential signal to the digital transmission line, the differential signal including a first signal and a second signal that are based on an encoded bit serial input signal, wherein absolute values of amplitudes of the first and second signals are 857.14 (mV) or larger.

Signal transmission device and signal transmission method

To provide a roller scraper capable of having a long service life. A roller scraper that removes attached substances on a surface of a roller, the roller scraper including a scraper main body that is supported on a floor portion and a scraping claw that is disposed in such a manner as to project in a width direction of the scraper main body. The scraping claw is placed against the roller in such a manner as to be in contact with the surface of the roller, and an opening is formed in the scraper main body.

Roller scraper

To stabilize an emitted electron beam, a thermoelectric field emission electron source includes: an electron source having a needle shape; a metal wire to which the electron source is fixed and configured to heat the electron source; a stem fixed to an insulator and configured to energize the metal wire; a first electrode having a first opening portion and arranged such that a tip of the electron source protrudes from the first opening portion; a second electrode having a second opening portion; and an insulating body configured to position the first electrode and the second electrode such that a central axis of the first opening portion and a central axis of the second opening portion coincide with each other, and to provide electrical insulation between the first and second electrodes, so as to provide a structure that reduces an amount of gas released when the first electrode is heated.

Thermoelectric field emission electron source and electron beam application device

Growing community of inventors

Tokyo, Japan

Takashi Doi