Anritsu Corporation

Takashi Aoki

Ken Mochizuki

Masaharu Uchino

Kazuhiko Ishibe

Seiya Suzuki

An apparatus for rapidly measuring jitter transfer characteristics is provided. A modulation signal generator generates a modulation signal M including a plurality of sinusoidal components having known amplitudes mto mand different frequencies fto f, and outputs the modulation signal M to a jitter generator. A clock signal C phase-modulated by the modulation signal M is input to a data signal generator, a data signal D synchronized with the clock signal C is provided to a measurement object, a data signal D' output from the measurement object is input to a clock recovery unit to recover a clock signal component C&#x2032;, and the clock signal component C&#x2032; is phase-detected by a phase detector. A signal amplitude detector detects the amplitudes of the plurality of sinusoidal components included in the modulation signal M from an output signal M&#x2032; of the phase detector, and an operation processor calculates a ratio of the detected amplitudes and the known amplitudes for each of the sinusoidal components, respectively.

Apparatus for measuring jitter transfer characteristic

A wander generator has a random number signal generator unit, a filter unit, a clock generator unit, a modulator unit, and a setting unit. The random number generator unit sequentially generates random number signals comprised of a plurality of bits at a constant speed in accordance with a predetermined algorithm. The filter unit receives a random number signal sequence generated by the random number signal generator unit for filtering. The clock generator unit generates a clock signal. The modulator unit modulates the frequency of clock signal generated by the clock generator unit with a signal output from the filter unit. The setting unit applies the filter unit with a signal for setting each amplitude value of a spectrum of a signal sequence output from the filter unit.

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Atsugi, Japan

Takashi Aoki