Hitachi, Ltd.

Takao Sukegawa

Takashi Saeki

Masaya Itoh

Masanori Miyoshi

Ryo Yumiba

Masato Kazui

Kouichi Shiraishi

Yoshiaki Matsuoka

Yasuhiro Suda

Hisao Oodawa

Mitsuru Terakado

Kouji Nosato

The object of the invention is to provide a supervising system for image to detect a scheme at high accuracy. The supervising system for image is provided with a first portion for detecting change of time detecting the change of time in amount of feature of an image taken pictures by a image forming device, a second portion for detecting change of time in the illuminance detected by an illuminance sensor, and a scheme judging portion detecting a scheme against the image forming device in accordance with the change of time in amount of feature and the change of time in the illuminance as detected.

Supervising system for image

A device which can support a determination of a camera layout by automatically preparing the camera layout that satisfies a customer request based on the customer request including a surveillance layout. Specifically, a need table that is a data set of a plurality of arrangement candidate cameras satisfying the customer request is prepared from the customer request including the surveillance layout. An arrangement of the plurality of the arrangement candidate cameras on a map is calculated based on the need table using a clustering method and a temporary layout of cameras is prepared. Then, an arrangement layout of the cameras in the surveillance layout is determined based on the temporary layout.

Camera layout determination support device

An monitoring apparatus, when detecting an abnormality in objects to be monitored by the monitoring apparatus or an abnormal state in the monitoring apparatus, which indicates the location or contents of the abnormality or abnormal state and also indicates a method for coping with it by sound or by OSD. When an administrator pushes a security-navi button, abnormality information in the objects to be monitored and a method for coping with it are displayed as a menu on the OSD. When the administrator operates the monitoring apparatus according to the displayed menu, the cause of the abnormality and a method for overcoming it can be provided.

Monitoring apparatus

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Yokohama, Japan

Takao Sukegawa