Shimadzu Corporation

Takao Marui

Tetsuya Yoneda

Keijiro Suzuki

Masashi Matsuo

An X-ray detector monitoring device capable of detecting a time when an X-ray detector is disabled due to a slow leak is provided. The X-ray detector monitoring device is provided with an X-ray detection elementfor detecting X-ray intensity, an X-ray detectorhaving a vacuum insulation containerin which an X-ray introduction windowis formed, a cooling meansfor cooling the X-ray detection element, a detection element temperature sensormounted on the X-ray detection elementto output detection element temperature information Tby detecting a temperature of an X-ray detection element, and a control unitandconfigured to calculate an output value for controlling the cooling meansto output the output value to the cooling meansso that the detection element temperature information Tbecomes a preset temperature T. The control unitandis configured to detect a vacuum state of the vacuum insulation containerbased on the output value.

X-ray detector monitoring device

A heat pump is used to cool an X-ray tube, and waste heat from the heat pump is used to heat a separate part (a spectroscope, for example). As a result, the X-ray tube can be cooled using the heat pump, and the waste heat from the heat pump resulting from the cooling thereof can be used to heat a separate part. In this way, by heating a separate part using the waste heat from the heat pump, it is possible to effectively utilize heat generated from the X-ray tube so as to reduce the power consumption.

X-ray generator and X-ray analyzer

The invention provides a sensitivity correction coefficient calculating system for an X-ray detector with which the sensitivity correction coefficient can be calculated using a multipurpose X-ray source instead of a specific X-ray source. In the sensitivity correction coefficient calculating system for an X-ray detector having a detection surface where detection elements for detection the X-ray intensity are aligned one-dimensionally or two-dimensionally, fitting is carried out on the measured X-ray intensity detected by a detection element using an approximation function so as to calculate the sensitivity correction coefficient using the calculated X-ray intensity calculated from the approximation function and the measured X-ray intensity.

X-ray diffraction device and sensitivity calibration method for X-ray diffraction device

The detection surface of each of a plurality of detection elements is arranged on an arc along a diffractometer circle (reference circle). This allows each detection element to detect X-rays diffracted by a specimen at the focal position. Because this prevents errors in the X-ray intensity detected by each detection element, more accurate diffraction information can be obtained. As a result, a more accurate analysis can be performed in less time by detecting X-rays diffracted by the specimen using a plurality of detection elements.

X-ray analyzer

A scanning reflection electron diffraction microscope causes a primary electron beam from its electron gun to be reflectively diffracted from a sample and a diffraction pattern to be formed on a fluorescent screen. An optical lens reduces this diffraction pattern in size and forms its reduced image on a photoelectric surface, thereby producing an image-carrying electron beam. Deflected by a deflecting system including a deflecting coil and a condenser coil, the image-carrying electron beam is detected by an electron-multiplier such that a diffraction pattern is displayed on a cathode ray tube.

Scanning reflection electron diffraction microscope

A detector for electrons diffracted by a sample irradiated with an electron beam uses a fluorescent screen to output optical signals representing the diffraction pattern formed by the diffracted electrons, and a TV camera to convert these optical signals to electrical signals. A photoelectric converter is used to determine the brightness of each position on the fluorescent screen but its position is controlled such that the converter will not obstruct the view of the fluorescent screen from the TV camera. Coordinate data on the positions at which the measured brightness is greater than a specified standard brightness value may be stored and relied upon in moving the photoelectric converter, or the light-receiving end of an optical fiber connected thereto, relative to the fluorescent screen.

Detector for diffracted electrons

A time-of-flight (TOF) type ion scattering spectroscope (ISS) using a mixture of ions of different masses. Ions having a mass smaller than the smallest mass of the atoms in the sample surface can precisely discriminate light-weight object atoms of slightly different masses. Ions having an intermediate mass between heavy-weight atoms and light-weight atoms in the sample surface can precisely discriminate heavy-weight object atoms of slightly different masses.

Growing community of inventors

Kyoto, Japan

Takao Marui