Fuji Electric Co., Ltd.

Takamasa Asano

Kazuhiro Koizumi

Naoki Takeda

Yoshiki Hasegawa

Yasuyuki Masunaga

Nobuyuki Niizuma

Yu Taniguchi

Kazutoshi Machida

Yoshihiro Nakamura

Shuhei Saito

A coin identification device includes: a first magnetic sensor detecting an amount of magnetic variation while the coin passes in the carrying direction; a second magnetic sensor installed where the second magnetic sensor detects a passage of an arc of a small-diameter coin when the first magnetic sensor detects a passage of the small-diameter coin; and a third magnetic sensor installed where the third magnetic sensor does not detect a passage of an arc of the small-diameter coin when the first magnetic sensor and the second magnetic sensor detect a passage of the small-diameter coin and detects a passage of an arc of a large-diameter coin; and an identification control unit identifying an outer diameter of the small-diameter coin and the large-diameter coin based on the amount of magnetic variation of the first magnetic sensor.

Coin identification device

Despite the desire to measure the composition and concentration of the microparticles included in a gaseous body sample serving as the measurement target, there is a problem that measurement cannot be performed accurately due to the effect of substances other than the gaseous body sample adsorbing to a trapping body of the analyzing apparatus that traps the microparticles, for example. Therefore, provided is a microparticle composition analyzing apparatus that analyzes composition of microparticles contained in a gaseous body sample, comprising a gas analyzer and a control section that sequentially introduces into the gas analyzer a comparative gas and a sample gas caused by the microparticles generated by irradiating the gaseous body sample with a laser.

Microparticle composition analyzing apparatus

A signal processing device () includes a noise generator () configured to have a noise strength set therein and to output a noise with a set noise strength; a noise adder () configured to add the noise to an input signal including a weak signal as a measurement target to generate a noise-added signal; a threshold processing circuit () configured to perform threshold processing on the noise-added signal; an evaluating circuit () configured to extract, from an output signal output from the threshold processing circuit, a pulse signal component that meets a pulse waveform condition and to evaluate the extracted pulse signal; and a strength setting circuit () configured to set, in the noise generator, a noise strength to a desired value based on an output from the evaluating circuit.

Signal processing device and noise strength determining method

A multifunctional particle analysis device includes a particle measuring device and a particle composition analysis device. Calibration particles for which at least the number, size, and composition thereof are known are input to the particle measuring device and the particle composition analysis device and analyzed. The sensitivity of the particle measuring device is calibrated in accordance with the number and size of the calibration particles as measured by the particle measuring device, and the sensitivity of the particle composition analysis device is calibrated in accordance with the mass composition of the calibration particles as measured by the particle composition analysis device. Moreover, the irradiation axis of particles that enter the particle composition analysis device relative to a capturing unit is calibrated in accordance with a state in which the calibration particles are captured on the capturing unit of the particle composition analysis device.

Multifunctional particle analysis device and method of calibrating the same

A signal processing device for detecting a weak signal in an input signal. The device includes first and second pulse detectors and a determining circuit. The first pulse detector adds noise to the input signal, and processes the noise-added signal using a first threshold, to thereby output a first signal having a first pulse waveform component, which corresponds to an interval in which a level of the noise-added input signal exceeds the first threshold. The second pulse detector receives the input signal in parallel with the first pulse detector, and processes the input signal using a second threshold, to thereby output a second signal having a second pulse waveform component, which corresponds to an interval in which a level of the input signal exceeds the second threshold. The determining circuit determines whether each of the first and second pulse waveform components conforms to the weak signal.

Signal processing device and radiation measurement device

A particle analyzing apparatus including a particle measuring section that measures a number or concentration of particles in a sample gas; a component analyzing section that measures an amount of each component of the particles in the sample gas; a flow path that branches into a first flow path that introduces the sample gas to the particle measuring section and a second flow path that introduces the sample gas to the component analyzing section; a first adjusting section that is provided in the first flow path and dilutes the sample gas with a dilution gas and introduces the diluted sample gas to the particle measuring section to adjust a measurement range of the particle measuring section; and a second adjusting section that is provided in the second flow path and adjusts an introduction time during which the sample gas is introduced to the component analyzing section.

Particle analyzing apparatus

A particle measuring device includes: an optical resonator that reflects laser light back and forth between two facing reflective mirrors in order to amplify an energy of that laser light and form resonant laser light; a particle transport unit that transports particles in an aerosol to be measured across a beam path of the resonant laser light; a scattered light receiving unit that receives scattered light produced when the particles in the aerosol are irradiated by the resonant laser light; and a processor that receives light reception signals from the scattered light receiving unit, wherein the processor outputs light reception pulses according to the light reception signals and calculates time intervals between the light reception pulses that are temporally adjacent.

Growing community of inventors

Hino, Japan

Takamasa Asano