Horiba, Ltd.

Horiba Stec, Co., Ltd.

Takahito Inoue

Hiroshi Uchihara

Kohei Sasai

Toshihiro Ikeyama

Kyoji Shibuya

Takuji Kurozumi

Yasushi Hirata

Kazushi Sasakura

An element analysis method is capable of maintaining accuracy of zero-point correction equivalent to that in the related art while shortening the time required for element analysis. The method includes heating a sample placed in a crucible in a heating furnace, and measuring an amount of an element contained in a gas discharged from the heating furnace by an analysis mechanism to analyze the element contained in the sample. The method includes: a blank measurement step of measuring the amount of the element contained in the gas discharged from the heating furnace when only the crucible is heated; and a step of setting an amount of zero-point correction based on a measurement value in a transient state region where the measurement value rises in blank data obtained in the blank measurement step.

Element analysis method, element analysis device, and non-transitory computer readable medium storing program for element analysis device

An elemental analysis device includes a heating furnace in which a test sample that is placed in a crucible is heated so that a sample gas is generated from the test sample, an inflow path through which a carrier gas is introduced into the heating furnace, an outflow path through which a mixture gas made up of the carrier gas and the sample gas is led out from the heating furnace, a dust filter that is provided on the outflow path, an analysis mechanism that is provided on the outflow path on a downstream side from the dust filter, and that detects one or a plurality of predetermined components contained in the mixture gas, and a cleaning gas supply mechanism that supplies cleaning gas to the dust filter in an opposite direction from a direction in which the mixture gas is flowing.

Elemental analysis device for analyzing test sample having cleaning gas supply mechanism

An elemental analysis device includes a first electrode and a second electrode between which a crucible MP containing a sample is nipped, and that heats the sample. The second electrode includes a second electrode main body that has a tip end having a substantially cylindrical shape, a second electrode tip, a cap that nips the second electrode tip between the cap and the second electrode main body such that a part of the second electrode tip is exposed to an outside, and a second screwing structure that includes a male thread and a female thread provided between the second electrode main body and the cap, and the second screwing structure further includes a purge groove that extends in a pitch direction and that is provided as a cutout provided to a part of crests of a thread of at least one of the male thread and the female thread.

Elemental analysis device

A sample analyzing apparatus analyzes a component to be measured securely while reducing a frequency of maintenance of the sample analyzing apparatus. The sample analyzing apparatus includes a heating furnace that heats a sample held by a sample holding body and a gas analysis section that analyzes a component to be measured contained in a gas generated by heating the sample, and the gas analysis section includes a laser light source that irradiates the gas with a laser light, and a photodetector that detects an intensity of a sample light as being the laser light that has transmitted through the gas.

Sample analyzing apparatus

A quadrupole mass spectrometer includes an ion source that ionizes a sample, a filter unit that includes a quadrupole and separates ions generated from the ion source according to mass, a detector that detects ions passing through the filter unit, a filter voltage controller that controls a filter voltage applied to the quadrupole to switch between a blocking mode in which ions entering the filter unit are not allowed to impinge on the detector and a passing mode in which ions entering the filter unit are allowed to impinge on the detector, the filter voltage including a radio-frequency voltage and a direct-current voltage, a baseline computing unit that computes a baseline based on outputs of the detector in the blocking mode, and an analyzing unit that outputs an analysis result of the sample based on outputs of the detector in the passing mode and the computed baseline.

Quadrupole mass spectrometer, quadrupole mass spectrometry method, and program storage medium storing program for quadrupole mass spectrometer

An objective of this invention is to conduct an accurate quantitative analysis on the Ar element contained in a sample gas by an element analysis device comprising a heating furnace and a mass spectrometer for conducting a quantitative analysis on an element in a vacuum atmosphere. The element analysis device comprises: a heating furnace that heats a graphite crucible containing a sample while introducing a carrier gas into the heating furnace, thereby vaporizing the sample to generate a sample gas; a quadrupole mass spectrometer that conducts the quantitative analysis on the Ar element contained in the sample gas in a mixed gas comprising the carrier gas and the sample gas discharged from the heating furnace, a first pressure regulator that controls the pressure of the carrier gas to be introduced into the heating furnace, and a second pressure regulator that controls the pressure of the mixed gas discharged from the heating furnace.

Element analysis device and element analysis method

In order to make it possible to remove dust produced in a heating furnacemore efficiently than ever before, the present invention is adapted to include: a dust discharge passage L that communicates with the inside of the heating furnaceand is for discharging dust produced by heating a sample X; a dust accommodating partthat accommodates the dust discharged from the dust discharge passage L; and a negative pressure generating mechanismthat is provided in the dust discharge passage L and generates negative pressure in the dust discharge passage, in which the negative pressure generated by the negative pressure generating mechanismguides the dust from the heating furnaceto the dust discharge passage L.

Analysis device

In order to surely discharge dust produced in a sample containing part, the present invention is adapted to include: a dust introduction partthat has a through-holeformed penetrating in a vertical direction and introduces dust produced in the sample containing partinto the through-hole; a dust containing partthat contains the dust discharged through the through-hole; and a dust discharge pathof which one end is connected to the dust introduction partto communicatively connect to the through-holeand the other end is connected to the dust containing part, in which the dust discharge pathis linearly formed along the vertical direction from the one end to the other end.

Growing community of inventors

Kyoto, Japan

Takahito Inoue