Omron Corporation

Takahiro Sakai

Hirotada Teranishi

Makoto Kondo

Yoshinobu Hemmi

Jiro Koyama

Hideaki Ozaki

Naoya Sasano

Naoyuki Kimura

Hitoshi Yoshida

Toshio Yamashita

Hidekazu Yoshioka

Si-Hun Choi

Yuki Kotake

Yoshihiro Shimizu

Rikuo Kawamura

A probe pin includes a coil spring extending and contracting along a center line, a first contact disposed on one side of the center line and having a rectangular cross section, and a second contact disposed on the other side of the center line and having a rectangular cross section. The first contact and the second contact are supported so as to be reciprocable via the spring coil and are electrically connected to each other. In particular, a contact surface of at least one of the first contact and the second contact is an inclined surface inclined so as to descend along a thickness direction.

Probe pin and electronic device using the same

A probe pin includes a first contact part and a second contact part; a middle part located between the first contact part and the second contact part; a first flexible part configured to move the first contact part relative to the middle part in the first arrangement direction; and a movable part configured to move the second contact part relative to the middle part in a direction intersecting with the first arrangement direction.

Probe pin, inspection jig, inspection unit and inspection device

A probe pin is provided with a plate-like movable pin including: a flexible part configured to extend and contract lengthwise; a first contact part and a second contact part each provided at an end of the flexible part lengthwise; and a conduction-path forming element overlapping the movable pin along the thickness thereof. The conduction-path forming element includes a first contact surface and a second contact surface at lengthwise ends configured to contact the first contact part and second contact part; the movable pin and the conduction-path forming element are arranged to allow the first contact part to remain in contact with the first contact surface and the second contact part to remain in contact with the second contact surface while allowing relative movement of the movable pin and the conduction-path forming element lengthwise.

Probe pin and inspection unit

A socket includes a first housing and a second housing each including a housing recessed portion capable of housing and holding a contact provided at its first end with a first contact portion and at its second end with a second contact portion while the first and second contact portions each are exposed, and a positioning member which positions the first and second housings independently of each other such that the housing recessed portion of the first housing and the housing recessed portion of the second of housing are disposed adjacent to each other to be paired.

Socket

A probe pin includes an elastic hollow cylinder that expands and contracts along a central axis, a conductive first plunger extending in the cylinder along the central axis from a first end of the cylinder, and a conductive second plunger extending in the cylinder along the central axis from a second end of the cylinder. The first and second plungers are coupled together in the cylinder in a manner movable relative to each other along the central axis. The first plunger includes a first plunger body contained in the cylinder, and a first terminal connected to the first plunger body and located outside the cylinder. The second plunger includes a second plunger body contained in the cylinder, and a second terminal connected to the second plunger body and located outside the cylinder. The first plunger body includes a slope that tapers in a direction from an outer side toward an inner side of the cylinder, comes in contact with the second plunger body inside the cylinder, and is urged in a direction crossing the central axis by relative movement of the first and second plungers. The first plunger body includes a deformable elastic portion between the first terminal and the slope.

Probe pin and inspection device including probe pin

A probe pin includes an elastic portion, a first contact portion having a pair of leg portions that extends from a first end of the elastic portion along a longitudinal direction and is bendable in a direction away from each other, and that has a pair of contact portions each of which is disposed at each tip of the pair of leg portion and is urged by the elastic portion in a direction along the longitudinal direction through the pair of leg portions to be able to be brought into contact with a projecting contact of an inspection object, and a second contact portion that is disposed at a second end of the elastic portion and is electrically connected to the first contact portion. Between the pair of leg portions, a gap into which the projecting contact of the inspection object can be inserted is provided, and in a state where the projecting contact is inserted into the gap, the pair of contact portions and the projecting contact can be brought into contact with each other.

Probe pin

A probe pin includes a coil spring, a first plunger, a first end of which is inserted from a first end of the coil spring into the coil spring and a second end of which is exposed to outside of the coil spring, and a second plunger, a first end of which is inserted from a second end of the coil spring into the coil spring to be in contact with the first end of the first plunger and a second end of which is exposed to the outside of the coil spring. The second plunger includes at least one elastic arm extending from the second end of the second plunger, and a touch portion is provided at a leading end of the elastic arm and displaceable in a direction intersecting an axial center direction when pressing force in the axial center direction is applied to the touch portion.

A contact terminal has a support section that holds an elastically deformable axle so as to rotate about the axle with an elastic deformation of the axle, and a contact section extending from the support section. The contact section has, at a distal end thereof, a contact portion configured to make a contact with a testing element. The contact section deforms elastically while rotating with the support section by the contact of the contact portion with the testing element.

Contact and electrical connection testing apparatus using the same

A probe pin includes a coil spring, a first plunger, and second and third plungers. The second and third plungers respectively are independently operable and include a main body and first and second elastic pieces that extend from the main body in the same direction to each other. The first plunger is inserted between the first and second elastic pieces each of the second and third plungers.

A contactor including a bellows body, a fixed portion connected to one end of the bellows body, and a movable portion connected to the other end of the bellows body, where the bellows body, the fixed portion and the movable portion are integrally molded by electroforming, and the movable portion is configured to be depressed to compress the bellows body, so that adjacent arc portions of the bellows body are brought into contact with each other to cause a short circuit.

Growing community of inventors

Moriyama, Japan

Takahiro Sakai