Yokowo Co., Ltd.

Murata Manufacturing Co., Ltd.

Takahiro Nagata

Takahiro Nakamura

Takeshi Todoroki

Masaki Noguchi

Takayuki Kawano

Yoshinori Ishikawa

Katsuo Miki

Kazumi Ookawara

Kazuhisa Honma

Tsuyoshi Yamato

Yoshiji Miyashita

Isao Samata

A first signal line pattern has one end electrically connected to a first connector. A second signal line pattern has one end electrically connected to a second connector. The second signal line pattern has the other end facing the other end of the first signal line pattern. A conductive block has a convex portion. The convex portion of the conductive block is electrically connected to a third portion of the conductive pattern positioned between the other end of the first signal line pattern and the other end of the second signal line pattern of the wiring board.

Inspection device

The inspection jig includes a rigid substrate, a flexible substrate connected to the rigid substrate, a support for supporting a part of the flexible substrate in a state that the part of the flexible substrate is protruded with respect to the rigid substrate, and a stretchable contactor provided on a protruding portion of the flexible substrate.

Inspection jig

An inspection jig includes a rigid substrate, a flexible substrate connected to the rigid substrate, a support supporting a part of the flexible substrate in a state that the part of the flexible substrate is protruded with respect to the rigid substrate in a first direction, a biasing unit configured to bias the support in the first direction with respect to the rigid substrate, and a contactor provided on a protruding portion of the flexible substrate, the protruding portion being protruded with respect to the rigid substrate. The contactor includes a contact housing, and a probe supported on the contact housing. One end of the probe is in contact with a contact portion on the protruding portion.

A testing device for testing an antenna-incorporated semiconductor device which is integrated with an antenna is provided. The testing device includes a non-contact probe configured to receive a radio wave emitted from the antenna in a state that the non-contact probe is not in contact with the antenna. The testing device may further include a movable base body configured to be lifted and lowered.

Testing device for antenna-incorporated semiconductor device

The inspection jig includes a rigid substrate, a flexible substrate connected to the rigid substrate, a contactor block for supporting a part of the flexible substrate in a state that the part of the flexible substrate is protruded with respect to the rigid substrate, a contactor provided on a protruding portion of the flexible substrate, and a spring probe supported by the contactor block, one end of which is in contact with a contact pad provided on a lower surface of the rigid substrate, and the other end of which protrudes from a protruding portion of the flexible substrate.

An exchangeable contact unit which can be attached to or detached from a main body of an inspection jig, includes: a flexible board which is provided with a contact part with respect to an object to be inspected; and a coaxial connector which is directly and electrically connected to the flexible board.

Exchangeable contact unit and inspection jig

A probe cover which is to be attached to a socket that is configured to support a plurality of contact probes, includes: a base; two positioning pins which are disposed on the base; and at least one supporting member which is disposed on the base. The two positioning pins and the supporting member are capable of positioning the base in a state where the base is separated from the socket by a predetermined distance, and a mutual separation distance between the two positioning pins is changeable.

Probe cover

Provided is a contactor that can be manufactured easily and secure a long stroke. A contactor includes: a flexible board; a plurality of contact point portions that are provided in the flexible board; a plurality of springs that urge the contact point portions respectively toward an inspection target device; and a housing that receives the plurality of springs. Each of the springs has a flat winding portion that is provided at least at an end portion of the spring on the contact point portion side, and a diagonal tight winding portion that is provided at a longitudinally intermediate portion of the spring. A gap is present between the flat winding portion and the diagonal tight winding portion in an uncompressed state of the spring.

Contactor with a plurality of springs and contact point portions urged by the springs

A block has a planar portion abutting a back side of a contact region of a flexible substrate, and a recess that is concave with respect to the planar portion. An electronic component mounted on the flexible substrate is located within the recess. When viewed from a direction perpendicular to the planar portion, the recess is located at a position near a power supply bump, except at a position overlapping the power supply bump, or the recess is filled with a filler. The planar portion of the block abuts only the back side of the power supply bump.

Contact unit and inspection jig

A contact probe includes a plurality of probes, each of the probes including: an conductive tube; an conductive plunger, contained in at least one end side of the tube, and having a distal end part protruding outward from the tube in an axial direction of the tube; and a coil spring, contained in the tube, and adapted to elastically urge the plunger outward. The plural probes are arranged in a first direction in a socket comprised of insulating material. A cross section of the tube in a direction perpendicular to the axial direction of the tube has a greater size in a direction different from the first direction than a size in the first direction.

Growing community of inventors

Tomioka, Japan

Takahiro Nagata