Mitsubishi Electric Corporation

Nihon Onkyo Engineering Co., Ltd.

Takahiro Mizuno

Hiroshi Wada

Yoshio Tadahira

Kazuki Tamura

Gaku Nakanishi

Osamu Kohashi

A test object includes a first semiconductor element, a first main electrode electrically connected to a positive electrode of the first semiconductor element, a second main electrode electrically connected to a negative electrode of the first semiconductor element, and a first capacitor connected between the first main electrode and the second main electrode. A semiconductor testing device comprises a DC power supply connected between a first probe and a second probe, and a controller. When the first probe is connected to the first main electrode and the second probe is connected to the second main electrode, the controller charges the first capacitor with a DC voltage supplied from a DC power supply, and inputs, to a control electrode of the first semiconductor element, a control signal for turning on the first semiconductor element, after charging the first capacitor.

Semiconductor testing device, semiconductor testing method, and manufacturing method for semiconductor device

Operation history information on every aircraft can be collected, and efficiency in collection of the aircraft operation history information can be improved. The present invention includes: an image acquisition unitconfigured to acquire an image G obtained by imaging a route R or A; an image-type model identification unitconfigured to identify a model of an aircraft P in the route R or Abased on appearance data of an aircraft Q in the image G acquired by the image acquisition unitand aircraft appearance samples previously prescribed for respective models; and an operation history storage unitconfigured to store image-derived model information identified by the image-type model identification unit

Device for collecting aircraft operation history information

To provide a power converter not to stop a DC power conversion of the power converter, when there is no abnormality in the main circuit of the power converter, and the command signal of output voltage has an abnormality. A power conversion circuit is provided with a voltage command upper limit circuit that upper-limits the voltage signal which is inputted to the switching control circuit by a preliminarily set upper limit voltage, wherein the voltage command upper limit circuit is provided with a Zener diode or a shunt regulator, wherein the Zener diode or the shunt regulator upper-limits the voltage signal by an upper limit voltage corresponding to Zener voltage or shunt voltage, and wherein a voltage command represented by the upper limit voltage is set to a voltage less than the protection determination voltage of the output overvoltage protection circuit.

Growing community of inventors

Tokyo, Japan

Takahiro Mizuno