Rigaku Corporation

Takahiro Kuzumaki

Tetsuya Ozawa

Akihiro Himeda

Atsushi Ohbuchi

Takayuki Konya

Miki Kasari

A quantitative analysis apparatus, a method, a program, and a manufacturing control system are provided. A WPPF sectionfor determining parameters of theoretical diffraction intensity by performing whole powder pattern fitting with respect to an X-ray diffraction profile to be analyzed, a scale factor acquiring sectionfor acquiring a scale factor of a test component among the determined parameters, a calibration curve storing sectionfor storing a calibration curve indicating a correlation between scale factors of the test component acquired with respect to a standard sample and content ratios of the test component in the standard sample, and a conversion sectionfor converting the scale factor of the test component acquired with respect to an objective sample into the content ratio of the test component in the objective sample using the stored calibration curve, are comprised.

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Tokyo, Japan

Takahiro Kuzumaki