Sony Corporation

Sony Semiconductor Solutions Corporation

Ricoh Company, Ltd.

Fuji Xerox Co., Ltd.

Takahiro Koyama

Tomoki Ono

Toyoharu Oohata

Hiroki Naito

Arata Kobayashi

Daisuke Saito

Sayaka Aoki

Jun Minakuti

Shinya Ishibashi

Shigehisa Kawabe

Mikio Takiguchi

Shigeru Tsujita

Masaomi Moritsu

Masayuki Tanaka

Nobuyuki Sato

Hiroyuki Okuyama

Hironobu Narui

Akira Masuda

Tadashi Kitai

Mikihiro Yokozeki

Takayuki Kawasumi

Michinori Shiomi

Masakazu Koyanagi

Mitsuaki Kita

Kensuke Kojima

Kengo Yamamoto

Masashi Wakatsuki

Kiyotaka Nakabayashi

Takahiko Kawasaki

Makoto Oogane

Yohta Mashiko

Hidekazu Aoyagi

Kenichi Sanpei

Toshinori Orito

Katsutoshi Itou

Yoshikazu Oochi

An inspection apparatus includes processing circuitry. The processing circuitry acquires read image data obtained by reading an image printed on both sides of a conveyance medium. The processing circuitry searches for marks printed on both sides of the conveyance medium in the read image data. The processing circuitry outputs information indicating a misalignment amount of both sides of the conveyance medium based on positions where the marks are printed.

Inspection apparatus, image forming system, misalignment measurement method and storage medium

An information processing apparatus includes circuitry configured to: acquire, as a first image, a read image of an image formed on a medium; generate a second image based on document data; detect reference points from the second image; compare the first image with the second image to calculate an amount of positional deviation of the medium for each of the reference points; detect, based on the amount of positional deviation, a malfunction of a conveying device that conveys the medium; cause an image forming apparatus to print a correction chart for correction of conveyance of the medium, in response to detection of the malfunction of the conveying device; calculate, from a read image of the correction chart, an amount of fluctuation in conveyance of the medium performed by the conveying device; and calculate a correction value for the calculated amount of fluctuation in conveyance of the medium.

Information processing apparatus, control method for information processing apparatus, image forming system, and non-transitory computer-readable storage medium for detection of malfunction of conveying device that conveys medium to print engine of image forming apparatus and correction of amount of conveyance performed by the conveying device based on the detection

An information processing apparatus includes circuitry. The circuitry is configured to acquire read image data of an image formed on a recording medium. The circuitry is configured to acquire output target image data according to which the image is formed. The circuitry is configured to generate, based on the output target image data, inspection image data for inspection of the read image data. The circuitry is configured to compare the read image data corrected based on an amount of deviation caused by conveyance of the recording medium with the inspection image data generated, to detect an image abnormality. The circuitry is configured to highlight and output a position of a portion of the image abnormality in the read image data before correction, based on the amount of deviation caused by conveyance of the recording medium, in response to the image abnormality being detected.

Information processing apparatus, output method, and non-transitory computer-readable storage medium which highlights an abnormality before correction

A semiconductor laser drive circuit includes: an anode electrode divided into at least one gain region and at least one light absorption region; a cathode electrode shared between the gain region and the light absorption region; and a resistance connected to the anode electrode of the light absorption region.

Semiconductor laser drive circuit, method for driving semiconductor laser drive circuit, distance measuring apparatus, and electronic apparatus

A distance measurement apparatus including at least one measurement unit, in which the measurement unit includes: a voltage level converter that applies an arbitrary bias to a voltage obtained on the basis of an output from a light receiver to offset a level of the voltage; an amplifier that amplifies a voltage output from the voltage level converter; and a measurement section that measures a timing at which an output from the amplifier reaches a predetermined threshold.

Distance measurement apparatus and distance measurement method

Provided is a distance measurement apparatus including a light projector that projects reference pulsed light to an object region, a light receiver that receives reflected pulsed light from the object region, and a scanning unit including a plurality of movable mirrors provided between the light projector and the object region and synchronously operated. The distance measurement apparatus further includes a calculation unit that calculates a distance to the object region on the basis of a difference between light projection timing of projecting the reference pulsed light and light receiving timing of receiving the reflected pulsed light.

Distance measurement apparatus and vehicle

A correction device including a photon number counting unit that counts a photon number on the basis of an output signal output from a light receiving unit, a correction value acquiring unit that acquires a correction value corresponding to the photon number, and a correction unit that performs correction based on the correction value.

Correction device, correction method, and distance measuring device

A ranging device provided with a light projecting unit for projecting a reference pulse set row including a main pulse and at least one sub pulse, a light receiving unit for receiving a reflected pulse set row obtained by reflection of the reference pulse set row by an object to be measured, and an identifying unit for identifying the reflected pulse set row corresponding to the reference pulse set row. The ranging device is further provided with a calculating unit for calculating a distance to the object to be measured on the basis of a delay time difference between the reference pulse set row and the reflected pulse set row corresponding to the reference pulse set row. The light projecting unit projects a plurality of reference pulse set rows having different pulse intervals.

Ranging device, ranging method, signal processing device, and light projecting device

A light-emitting element wafer including a supporting substrate, a luminescent layer that is formed of a semiconductor and has a first surface and a second surface, the first surface including a first electrode, the second surface including a second electrode, the second surface being arranged between the supporting substrate and the first surface, a junction layer that joins luminescent layer to the supporting substrate and is arranged between the supporting substrate and the second surface, a first inorganic film formed on the first surface, a second inorganic film formed between the junction layer and the second surface, an isolation trench portion that isolates elements and is formed to have a depth such that the isolation trench portion extends from the first inorganic film to the supporting substrate, and a third inorganic film that connects the first inorganic film and the second inorganic film.

Light-emitting element wafer, light emitting element, electronic apparatus, and method of producing light-emitting element wafer

A distance measurement apparatus includes at least one measurement unit. The measurement unit includes a first light reception section including a plurality of photon counting type light reception devices connected to each other and a first conversion section that converts a current outputted from the first light reception section into a voltage. The measurement unit further includes a first amplification section that outputs an amplification value obtained by amplifying the voltage outputted from the first conversion section and outputs, when the amplification value exceeds a given limit value, the limit value as the amplification value. The measurement unit further includes a first measurement section that measures a timing at which the output value from the first amplification section reaches a given threshold value.

In a semiconductor laser according to an embodiment of the present disclosure, a ridge part has a structure in which a plurality of gain regions and a plurality of Q-switch regions are each disposed alternately with each of separation regions being interposed therebetween in an extending direction of the ridge part. The separation regions each have a separation groove that separates from each other, by a space, the gain region and the Q-switch region adjacent to each other. The separation groove has a bottom surface at a position, in a second semiconductor layer, higher than a part corresponding to a foot of each of both sides of the ridge part.

Semiconductor laser, electronic apparatus, and method of driving semiconductor laser

In a semiconductor laser according to an embodiment of the present disclosure, a ridge part has a structure in which a plurality of gain regions and a plurality of Q-switch regions are each disposed alternately with each of separation regions being interposed therebetween in an extending direction of the ridge part. The separation regions each have a separation groove that separates from each other, by a space, the gain region and the Q-switch region adjacent to each other. The separation groove has a bottom surface at a position, in a second semiconductor layer, higher than a part corresponding to a foot of each of both sides of the ridge part. The semiconductor laser includes an electrode provided over the bottom surface of each separation groove with an insulating layer being interposed therebetween.

A light-emitting element wafer includes a supporting substrate, a luminescent layer that is formed of a semiconductor and has a first surface and a second surface, the first surface including a first electrode, the second surface including a second electrode, the second surface being arranged between the supporting substrate and the first surface, a junction layer that joins luminescent layer to the supporting substrate and is arranged between the supporting substrate and the second surface, a first inorganic film formed on the first surface, a second inorganic film formed between the junction layer and the second surface, an isolation trench portion that isolates elements and is formed to have a depth such that the isolation trench portion extends from the first inorganic film to the supporting substrate, and a third inorganic film that connects the first inorganic film and the second inorganic film.

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Kanagawa, Japan

Takahiro Koyama