Ihi Inspection and Instrumentation Co., Ltd.

National Institute of Advanced Industrial Science and Technology

Ishikawajima Inspection & Instrumentation Co., Ltd

Takahiro Arakawa

Hiraku Kawasaki

Hideyuki Nakamura

Hiroshi Tsuda

Shintaro Fukumoto

Tatsuya Hikichi

Saburou Shibata

Jung-Ryul Lee

Tomio Nakajima

A plurality of ultrasonic transducers of the invented probe are separated in a concentric circle pattern, separated in rows that are orthogonal to a reference line L that passes through the center of circles, and positioned line symmetrically with respect to the reference line L. The detection surface of the invented probe has a circular shape having the diameter D, and has a plurality of segments divided into a plurality of arc-shaped portions that are symmetrical with respect to the reference line L. Further a controller which has a plurality of control channels for controlling pairs of the line symmetrical ultrasonic transducers under the same conditions is provided.

Phased-array flaw-detection device and method

An ultrasonic transmitterattached to an inspecting target object, an ultrasonic receiverreceiving a reflected wave of the ultrasonic wave that has propagated from the ultrasonic transmitterin the inspecting target object, a data processing deviceacquiring position specifying data for specifying a position of a defectin the inspecting target objecton the basis of received data representing a waveform of the reflected wave received by the ultrasonic receiverare provided. The ultrasonic wave generated by the ultrasonic transmitterhas been frequency-modulated, and has a waveform composed of components of respective frequencies that are deviated from a resonance frequency of the ultrasonic transmitterand the ultrasonic receiver. The data processing deviceincludes a pulse compressing unitperforming pulse compression on the received data, and acquires the position specifying data on the basis of the pulse-compressed received data.

Ultrasonic inspection device and method

There is provided a system always capable of detecting AE/ultrasound received by an FBG, even when the FBG receives a change in temperature or strain and the Bragg wavelength is fluctuated. In the AE/ultrasound detection system, the reflected light from the FBG is caused to enter a Fabry-Perot filter having an FSR equal to or greater than the reflection wavelength band of the FBG. A change in the intensity of the transmitted light corresponds to the AE/ultrasound received by the FBG. Alternatively, the reflected light from FBG is caused to enter two Fabry-Perot filters having an FSR equal to or greater than the reflection wavelength band of the FBG and having the filter-transmittance peak wavelengths different from each other by FSR/4. The intensity of the transmitted light from each of the two Fabry-Perot filters is converted into a voltage signal, and the individual signals are subjected to addition and subtraction processes. Thus, a signal having a large amplitude corresponding to the AE/ultrasound received by the FBG can be obtained.

AE/ultrasound detection system, and material monitoring apparatus and nondestructive inspection apparatus equipped the system

Growing community of inventors

Yokohama, Japan

Takahiro Arakawa