Adacotech Incorporated

Takahide Ibe

Nobuyuki Otsu

Keiichi Ito

An abnormality detection device calculates high-dimensional feature values from real world data; projects, by using a matrix generated from real world data collected for learning so as to project the feature values onto an abnormality discriminant space, feature values calculated from real world data which is input for inspection onto an abnormality discriminant space, the abnormality discriminant space being used for determining presence or absence of an abnormality; judges the presence or absence of an abnormality from a distribution in the abnormality discriminant space; identifies, if an abnormality is found and if the abnormality is a known abnormality, the content of the abnormality from a trend of a distribution in the abnormality discriminant space and presenting the content of the abnormality; and visually displays a distribution in the abnormality discriminant space as a detection result of an abnormality.

Growing community of inventors

Saitama, Japan

Takahide Ibe