Sharp Kabushiki Kaisha Corporation

Takafumi Hayama

Katsumi Irie

Nobuyuki Kawase

Touko Kasahara

Yuuichirou Mochizuki

Tsuyoshi Nagai

Hiroshi Shibuya

A liquid crystal display panel () includes a TFT substrate (), a CF substrate () facing the TFT substrate (), a liquid crystal layer () provided between the TFT substrate () and the CF substrate (), an alignment film configured to control alignment of the liquid crystal layer (), and a sealing member () sandwiched between the TFT substrate () and the CF substrate () and formed in the shape of a frame surrounding the liquid crystal layer (). In a region () where the sealing member () is to be provided, a metal pattern () is provided which is configured to reflect infrared light emitted from a Fourier transform infrared spectrometer toward the Fourier transform infrared spectrometer in order to determine the presence or absence of the alignment film in the region ().

Liquid crystal display panel, and method for testing substrate for liquid crystal display panel

A liquid crystal panel () comprises a liquid crystal injection port () for injecting liquid crystal between a pair of substrates, wherein a metal pattern () capable of reflecting infrared is provided in a region for providing a sealing resin for sealing the liquid crystal injection port ().

Liquid crystal panel, liquid crystal display device, and method for inspecting sealing resin

Disclosed herein is a method for detecting a defect of an active matrix liquid crystal panel, the method including a step of inputting a data signal for displaying an image having a luminance level lower than a maximum luminance level to a first signal line while inputting a data signal for displaying a black image to a second signal line and a third signal line, the second signal line and the third signal line adjoining the first signal line, thereby causing pixels corresponding to the first signal line to display a single color. According to the method of the present invention, any defective pixel is displayed darker than normal, owing to a decrease in the transmittance, so that point defects such as S-D leak defects can be easily detected.

Method for detecting defects in an active matrix liquid crystal display

In the case where a possible defect of a liquid crystal panel is detected, after the liquid crystal panel is put into an oven with the liquid crystal panel being energized, a second inspecting pulse, which has a larger potential difference than a potential difference of a first inspecting pulse applied to a second signal line on an active matrix substrate, is applied to a second signal line. In the above method, since an insulating layer, which is on the verge of breakage, between a source line and the second signal line can be broken, a possible defect of the liquid crystal panel can be detected as a cross bright line by inspection for turning-on in the panel inspecting step. For this reason, in this method, accuracy of detecting a possible defect can be improved, and the number of S-G leaks in the market is decreased greatly, thereby improving display quality of the liquid crystal panel.

Method of detecting possible defect of liquid crystal panel

Common lines are formed in parallel with gate lines. A line which joins those parallel lines is provided in parallel with source lines on the substrate edge part on the gate line terminals side. Another line which joins the same parallel lines is provided in parallel with source lines on the substrate edge part on the opposite side of the gate line terminals. These two terminals are supplied with a signal which is identical with the common signal being applied to an opposing electrode. Depressed portions are provided for each pixel electrode at positions where the source line and common line intersect with each other or in the vicinity of the source line on both sides thereof.

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Tenri, Japan

Takafumi Hayama