Hitachi, Ltd.

Takaaki Kumazawa

Aritoshi Sugimoto

Yuichi Hamamura

Kazuyuki Tsunokuni

Hisao Asakura

Noriaki Yamamoto

Masataka Tanaka

Masayuki Ichinohe

Yoshiharu Sekiya

An inspection-required product selection method and program for minimizing the number of investigation steps at the time of a defect occurrence for a product placed on the market are disclosed. A combination of product lots to be inspected is assumed based on the information on the material lots used for a product lot scheduled for production for a predetermined future period and the number of the product lots inspected during the same period. The number of the material lots not included in the product lots to be inspected is totalized for each product lot, and the statistical values are calculated for all the conceivable combinations of the product lots. The combination of the product lots optimizing the statistical values is selected for inspection.

Method and program for selecting product to be inspected

A technology is provided in which it is not necessary to modify a system on a production side, and in which man-hours required for registering an environmental load value on a supplier side are not increased, in cases of an item having a mismatch between units, in a process of adding up the environmental load values of a post-production product. The technology includes generating correction information for calculating the environmental load that is registered by the supplier at design time, and calculating the environmental load value at design time by using the correction information. In cases of calculating the environmental load value of a product actually produced from a designed product, the environmental load value is calculated using the correction information generated at design time.

Method for calculating environmental load, program for calculating environmental load, and method for converting units

A manufacturing method of an electronic device is to improve test efficiency using test structure and improve yield. The manufacturing method performs test using a first lead wire disposed on an insulating layer formed on a substrate and a second lead wire electrically connected to the substrate and disposed on the insulating layer and manages the electronic device on the basis of results of the test to manufacture the electronic device. The manufacturing method includes a step of testing whether the first lead wire is disconnected or not by measuring an electric resistance between both ends of the first lead wire and a step of testing whether the first and second lead wires are short-circuited or not by measuring an electric resistance between the first lead wire and the substrate.

Growing community of inventors

Tokyo, Japan

Takaaki Kumazawa