Asahi Kasei Microdevices Corporation

Mitsubishi Jukogyo Kabushiki Kaisha

Takaaki Furuya

Toshiro Sakamoto

Keiichiro Kuwata

Shota Isshiki

Tatsushi Yagi

Shigeyasu Ishigami

Norihisa Kobayashi

Jun Izumi

Yuji Ikeda

Hiromichi Toda

Tsuyoshi Akagi

Koichiro Ueno

Daiki Yasuda

Takahisa Shikama

Naoya Ugomori

An authentication system includes: a sensor including an instrumentation unit configured to instrument environment information about an environment in a space to be authenticated, a generating unit configured to generate statistical information about the environment of the space based on the environment information, and a communication unit configured to transmit the statistical information to an authentication server configured to authenticate the space based on the statistical information; and the authentication server. The authentication server includes an authentication unit configured to authenticate the space based on the statistical information.

Authentication system, authentication server, and sensor

A risk information provision device is provided, comprising: an information acquisition unit for acquiring risk information related to a risk depending on a status of a carbon dioxide concentration in a determination target and risk handling information for handling the risk, wherein the status of the carbon dioxide concentration is determined based on a temporal change in the carbon dioxide concentration in the determination target; and a provision unit for providing at least one of the risk information or the risk handling information, wherein the risk handling information includes recipient information related to a recipient to which the risk information is provided, and the provision unit is configured to provide the risk information to the recipient.

Risk information provision device, risk information provision system, risk information provision method, and computer-readable medium

Provided is an apparatus with a gas detection function capable of detecting a detection target gas with high accuracy. An apparatus with a gas detection function comprises: a housing (); a vibration source (); and a gas measurement unit () located inside the housing and demarcated by a partition, wherein the vibration source is located outside the gas measurement unit, the gas measurement unit includes a detector () located on a substrate (), and a gas detection space () provided with a hole () through which a gas passes, and a frequency f expressed by the following Formula (1):

Apparatus with gas detection function

A gas detection apparatus includes a light emitting part; a light receiving part; and a light guiding part for guiding light from the light emitting part to the light receiving part. When a region inside the ellipsoid Eand not including the ellipsoid Eis defined as a region R, the ellipsoid Eincluding a light source region of the light emitting part is defined as an ellipsoid E, the ellipsoid Eincluding a light receiving region of the light receiving part is defined as an ellipsoid E, the region Rof the ellipsoid Eis defined as a region R, and the region Rof the ellipsoid Eis defined as a region R, the point Gis present in the region Rand the point Gout is present in the region R.

Gas detection apparatus

Provided is an optical element, in which: an internal wiring portion electrically connects a first contact electrode portion and a second contact electrode portion to each other; a second region, an active layer and a second conductive semiconductor layer form a mesa structure; a pad electrode is placed so as to cover a plurality of unit elements, and is electrically connected to at least one of the first contact electrode portion and the second contact electrode portion; a first insulating portion is placed between the pad electrode and a first region of a side surface of a mesa structure and a first conductive semiconductor layer; and a diameter of a circle circumscribed to a region where the pad electrode and a connection portion are in contact with each other is 15% or more of a length of a short side of a substrate.

Optical element and optical concentration measuring apparatus

A gas detection devicecomprises: a light emitterconfigured to emit light of a wavelength band including a wavelength absorbed by a detection target gas; a light detectorhaving sensitivity to the wavelength band; a package; a light guideconfigured to guide the light to the light detector; a jointjoining the packageand the light guide; and a heat insulatorlocated in a gap between the packageand the light guide, wherein part of a surface of the packagefacing the light guidehas a proximity region D where a distance between the packageand the light guideis 500 μm or less, and at least part of the heat insulatorand at least part of the jointare located adjacent to each other in part of the proximity region D.

Gas detection device

The gas detection apparatus comprises a figure of all or a part of n ellipsoids. When a region inside the ellipsoid Eand not including the ellipsoid Eis defined as a region R, the ellipsoid Eincluding a light source region of the light emitting part is defined as an ellipsoid E, the ellipsoid Eincluding a light receiving region of the light receiving part is defined as an ellipsoid E, the region Rof the ellipsoid Eis defined as a region R, and the region Rof the ellipsoid Eis defined as a region R, 60% or more of the light source region is present in the region Rand 60% or more of the light receiving region is present in the region R.

Provided is an optical densitometer for measuring a density of a gas or liquid of interest, the optical densitometer comprising: a light source capable of introducing light into a core layer; a detector capable of receiving the light that has propagated through the core layer; and an optical waveguide, the optical waveguide comprising: a substrate; and the core layer comprising a light propagation portion capable of propagating the light in an extending direction of the light propagation portion, and a diffraction grating portion, the diffraction grating portion comprising a diffraction grating region and an extension region connected to the diffraction grating region, and a first optical coupling region included in the extension region and a second optical coupling region included in the light propagation portion being optically coupled with respect to the light propagating through the core layer.

Optical densitometer and optical waveguide

An optical concentration measurement device includes an LED light source, alight receiving unit having a rectangular light receiving surface and outputting a detection signal representing intensity of received light, and light guiding units guiding light emitted by the LED light source to the light receiving unit, wherein a shape on the rectangular light receiving surface of light radiated on the light receiving surface is rectangular, the optical concentration measurement device measures concentration of an object to be measured existing in a light path formed by the light guiding units, based on the detection signal output from the light receiving unit, and the light guiding units guide light at a diffraction limit or greater in such a way that area of the light on the rectangular light receiving surface is ½ or less of area of the rectangular light receiving surface.

Optical concentration measurement device comprising light receiving unit with a rectangular light receiving surface

A gas detection apparatusincludes a substrate; a light emitting elementprovided on a main surface of the substrate for emitting light; a light receiving elementprovided on the main surface of the substratefor receiving the light; a light guide memberfor guiding the light emitted by the light emitting elementto the light receiving element; a first joint member; and a second joint member. The first joint member joins the substrate and the light guide member, limits a displacement in a direction parallel and/or orthogonal to the main surface of the substrate. The second joint member joins the substrate and the light guide member, limits a displacement of the light guide member in a direction parallel to the main surface of the substrate and/or limits a displacement within a plane orthogonal to the main surface of the substrate.

Provided is a gas detection apparatus which suppresses occurrences of distortions of the optical path to reduce fluctuations of the gas detection sensitivity. A gas detection apparatusincludes a substrate; a light emitting elementdisposed in a first regionin a main surfaceof the substratefor emitting light; a light receiving elementdisposed in a second regionin the main surfaceof the substratefor receiving the light; a light guide memberfor guiding the light emitted by the light emitting elementto the light receiving element; and a joint memberjoining the substrateand the light guide member. The joint memberserves as a rotation axis when the light guide memberis displaced relative to the substrate

An optical chemical analysis apparatus () includes an optical waveguide () and a light source (). The optical waveguide () has a core layer () that includes a light propagator (), through which light can propagate in an extension direction, and a diffraction grating (first diffraction grating ()) that connects optically to the light propagator (). The light source () is configured to inject the light into the diffraction grating by emitting incoherent light. The diffraction grating further includes a light intake region for introduction of light from the light source, and the light source includes at least one light emitting point at a position such that the difference between the shortest optical distance Lab to the light intake region and the longest optical distance Lac to the light intake region is less than half of the wavelength, in a vacuum, of the light.

Optical chemical analysis apparatus

It is an object of this invention to provide an optical waveguide, an optical concentration measuring device, and a method for manufacturing an optical waveguide capable of achieving an improvement of evanescent wave exuding efficiency of propagating light and light extraction efficiency. A core layer provided in an optical waveguide has a first portion having a first film thickness, a second portion having a second film thickness different from the first film thickness, and a third portion connecting the first portion and the second portion. The third portion is formed so that the film thickness is gradually increased from the second portion having the smaller film thickness toward the first portion having the larger film thickness between the first portion and the second portion, and the maximum inclination angle is 10&#xb0; or more and 45&#xb0; or less.

Optical waveguide, optical concentration measuring device, and method for manufacturing optical waveguide

Sticking of core layer is suppressed, and deterioration of sensitivity of a sensor is prevented. An optical waveguide () includes a substrate (), a core layer (), a support, and a protrusion (). The core layer () can transmit light. The support connects at least a portion of the substrate () and a portion of the core layer () together. The support supports the core layer (). The protrusion () is arranged at a position different from a position of the support in a space between the substrate () and the core layer (). The protrusion () has a maximum height at a position deviated from a central position cp of the core layer () in a width direction. The protrusion () protrudes toward the core layer () from the substrate ().

Optical waveguide and optical concentration measuring apparatus

An optical density measuring apparatus for measuring density of a gas or a liquid to be measured includes a light source capable of irradiating light into a core layer, a detector capable of receiving light propagated through the core layer, and an optical waveguide that includes a substrate and the core layer. The core layer includes a light propagation unit and a first diffraction grating unit that receives light from the light source and guides the light to the light propagation unit, which includes a propagation channel capable of propagating light in an extending direction of the light propagation unit. The first diffraction grating unit is disposed near to and facing a light-emitting surface of the light source. The first diffraction grating unit includes first diffraction gratings, at least two of which receive light emitted from the same light-emitting surface of the light source.

Growing community of inventors

Tokyo, Japan

Takaaki Furuya