Panasonic Intellectual Property Management Co., Ltd.

Takaaki Amada

Takeo Azuma

Satoshi Sato

Nobuhiko Wakai

Hiroki Takeuchi

Kohsuke Yoshioka

Yoshinao Kawai

Noritaka Shimizu

Yoko Kawai

Takeshi Murai

A depth acquisition device includes memory and processor performing: acquiring, from the memory, intensities of infrared light emitted from a light source and measured by imaging with the infrared light reflected on a subject by pixels in an imaging element; generating a depth image by calculating a distance to the subject as a depth for each pixel based on an intensity received by the pixel; acquiring, from the memory, a visible light image generated by imaging, with visible light, a substantially same scene with a substantially same viewpoint and at a substantially same timing as those of imaging the infrared light image; detecting, from the visible light image, an edge region including an edge along a direction perpendicular to a direction of movement of the visible light image; and correcting, in the depth image, a depth of a target region corresponding to the edge region in the depth image.

Depth acquisition device and depth acquisition method

A depth acquisition device includes a memory and a processor. The processor performs: acquiring timing information indicating a timing at which a light source irradiates a subject with infrared light; acquiring, from the memory, an infrared light image generated by imaging a scene including the subject with the infrared light according to the timing indicated by the timing information; acquiring, from the memory, a visible light image generated by imaging a substantially same scene as the scene of the infrared light image, with visible light from a substantially same viewpoint as a viewpoint of imaging the infrared light image at a substantially same time as a time of imaging the infrared light image; detecting a flare region from the infrared light image; and estimating a depth of the flare region based on the infrared light image, the visible light image, and the flare region.

Imaging device, imaging method, and information processing device

A depth acquisition device includes a memory and a processor. The processor performs; acquiring timing information indicating a timing at which a light source irradiates a subject with infrared light; acquiring an infrared light image stored in the memory, the infrared light image being generated by imaging a scene including the subject with the infrared light according to the timing indicated by the timing information; acquiring a visible light image stored in the memory, the visible light image being generated by imaging a substantially same scene as that of the infrared light image, with visible light from a substantially same viewpoint and at a substantially same imaging time of those of the infrared light image; detecting a dust region showing dust from the infrared light image; and estimating a depth of the dust region based on the infrared light image, the visible light image, and the dust region.

Depth acquisition device and depth acquisition method including estimating a depth of a dust region based on a visible light image

A depth acquisition device includes a memory and a processor performing: acquiring, from the memory, intensities of infrared light measured by imaging with infrared light emitted from a light source and reflected on a subject by pixels in an imaging element; generating a depth image by calculating the distance for each pixel based on the intensities; acquiring, from the memory, a visible light image generated by imaging, with visible light, the substantially same scene from the substantially same viewpoint at the substantially same timing as those of the infrared light image; detecting a lower reflection region showing an object having a lower reflectivity from the infrared light image in accordance with the infrared light image and the visible light image; correcting a corresponding lower reflection region in the depth image in accordance with the visible light image; and outputting the depth image with the corrected lower reflection region.

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Kyoto, Japan

Takaaki Amada