Arkray, Inc.

Taizo Kobayashi

Yasunori Shiraki

Yasuhide Kusaka

Tokuo Kasai

Tetsuya Sakata

The present invention relates to an analytical tool (X) which includes a substrate (), a flow path for moving a sample along the substrate (), a reagent portion () provided in the flow path, and an insulating film () covering the substrate () and including an opening () for defining a region for forming the reagent portion (). The insulating film () further includes at least one additional opening () positioned in a longitudinal direction (N) relative to the opening (). For instance, the flow path is configured to move the sample by capillary force.

Analysis implement with opening in insulation film

The present invention relates to an analytical tool (X) to be mounted to an analytical apparatus () which includes a plurality of terminals () and an analysis circuit (). The analytical tool includes a plurality of electrodes () coming into contact with the plurality of terminals () when mounted to the analytical apparatus (). In the analytical tool (X), at least one () of the electrodes () serves as a disturbing-noise countermeasure electrode to which disturbing noise is more likely to come in comparison with the other electrodes () than the above-mentioned electrode ().

Analysis instrument

The measurement instrument includes an attribute information output section to output attribute information about the attributes of the measurement instrument as an electric physical value. The attribute information is based on at least one of the conditions including a resistance of the attribute information output section, a location of the attribute information output section, and the size of a region on which the attribute information output section is formed. The attribute information may be used to select the calibration curve suitable for the measurement instrument. The attribute information may be one that relates to a specific measurement standard applied to the measurement instrument.

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Kyoto, Japan

Taizo Kobayashi