Nec Corporation

Taisuke Tanabe

Junichi Abe

Akira Tsuji

Hiroshi Matsumoto

Shigeo Suzuki

Yoshimasa Ono

Jiro Abe

Takanori Shigeta

A detection device () according to the present disclosure includes an acquisition unit () that acquires point cloud data indicating a distance to an object and luminance information obtained from reflected light of a beam emitted when the point cloud data is measured, an edge detection unit () that performs edge detection based on the luminance information, a classification unit () that classifies, based on distribution of points contained in a crack candidate being a set of points detected as an edge, a plurality of the crack candidates into one of groups, and a label assignment unit () that accepts input of a label regarding the group from a user having visually recognized a shape of the crack candidate belonging to the group.

Detection device, label assignment method, and non-transitory computer-readable medium

An abnormal part display apparatus, an abnormal part display system, an abnormal part displaying method, and an abnormal part displaying program capable of improving visibility of an abnormal part in an object are provided. An abnormal part display apparatusaccording to the present disclosure includes an acquisition unitconfigured to acquire point group data of an object obtained by measuring the object by using a laser ranging apparatus, and a photograph image of the object obtained by photographing the object by using a photographing apparatus, a display unitconfigured to display the point group data and the photograph image on a predetermined screen, and a control unitconfigured to control the point group data and the photograph image to be displayed in the display unit

Abnormal part display apparatus, abnormal part display system, abnormal part display method, and abnormal part display program

Growing community of inventors

Tokyo, Japan

Taisuke Tanabe