Other

Rigaku Corporation

Taisei Hirayama

Ryo Hattori

Yoshihiro Notani

Shinichi Miyakuni

Shuichi Matsuo

Koichiro Ito

Yoshitsugu Yamamoto

Masanobu Inami

Yoshitugu Yamamoto

In a method for measuring thermo electricity and an apparatus thereof, enabling to measure the physical characteristics including electrification of a sample even in a humid (water-vapor) atmosphere, a sampleof powder to be measured and formed in a predetermined shape is disposed within an inside of an electric furnace, building up a heating and temperature increasing portion, which is stored within a constant-temperature container of three(3)-layers () structure (or may be two(2)-layers structure), forming a measuring chamberin an inside thereof. While increasing the temperature, a measuring apparatus for detecting the thermal stimulated current (TSC) by means of a minute current detector connected to electrodes, which are provided opposing to the sample, and there is further provided a water-vapor generating apparatusfor guiding a water-vapor atmosphere at a predetermined value into the measuring chamberof the constant-temperature container. Further, the temperature of the constant-temperature water supplied from a constant-temperature water supply apparatus into the constant-temperature container is set to be a little bit higher than that of the water-vapor atmosphere supplied from the water-vapor generating apparatus

Thermoelectric measuring method and thermoelectric measuring apparatus using thereof

In a sample assembly for a thermoelectric analyzer, typically TSC (Thermally Stimulated Current) analyzer, a sample is fixed to an electrically-insulating substrate via an adhesive layer. The material of the adhesive layer is indium or gold-tin alloy. The substrate has a pair of junction electrode layers formed thereon and a pair of electrode layers formed on the same plane of the sample. One of the electrode layers is connected with one of the junction electrode layers by electrically-conductive wire, while the other of the electrode layers is connected with the other of the junction electrode layers by another electrically-conductive wire. The substrate is made of preferably made of a highly electrically-insulating and highly thermally-conductive material which may be, for example, aluminum nitride (AlN), boron nitride (BN), beryllium oxide (BeO) or aluminum oxide (Al O ). The sample may preferably be a compound semiconductor such as GaAs.

Sample assembly for thermoelectric analyzer

A method of measuring a surface leakage current includes applying a voltage between a pair of electrodes, which are apart from each other on a sample surface, during a predetermined period of time. A region of the sample surface between the pair of electrodes is irradiated by energy rays during an irradiation period of time which is within the voltage application time. The energy rays may be lasers, ultraviolet rays, X-rays or an electron beam. A current flowing between the pair of electrodes is measured during the voltage application time. The energy rays irradiation causes a surface leakage current, which is caused by adhered substances, to start to flow, and when the adhered substances have been eliminated perfectly, a relatively large current caused by the adhered substances disappears. Perfect elimination of the adhered substances can be verified by confirming that the relatively large current has disappeared.

Method for measuring surface leakage current of sample

Growing community of inventors

Akishima, Japan

Taisei Hirayama