Canon Kabushiki Kaisha

Taihei Mukaide

Masatoshi Watanabe

Kazuhiro Takada

Kazunori Fukuda

Tomohiro Watanabe

Kazuyuki Ueda

Jun Yamamoto

Akira Morita

Takashi Noma

Toshihiko Ouchi

Ryo Hayashi

Hisato Yabuta

Shintaro Kasai

Nobuyuki Kaji

Hidenosuke Itoh

Nao Nakatsuji

Mitsuru Ohtsuka

Provided is a method for acquiring information relating to a composition of a detected object from results of a measurement, using radiation, this method including: a step for acquiring by a computer a result of measuring the detected object using radiation; a step for estimating by a computer a chemical composition ratio of the detected object, using an equation that contains a value derived from the measurement result as a constant and contains a value derived from the chemical composition ratio of the detected object as a variable, and then solving the equation; and a step for outputting the estimated chemical composition ratio or a physical property value acquired based on the estimated chemical composition ratio as information relating to the composition of the detected object.

Object information acquisition method and object information acquisition apparatus

A computing device configured to obtain information about a subject using a detection result detected by an X-ray detector which detects an X-ray passing through the subject, which device includes: a unit configured to obtain a detection result of the X-ray detector; a first obtaining unit configured to obtain a complex refractive index of the X-ray after passing through the subject using the detection result; and a second obtaining unit configured to obtain information about the subject in accordance with a correlation between the complex refractive index and a mass absorption coefficient.

Computing device, computing program, X-ray measuring system and X-ray measuring method

An apparatus for deriving X-ray absorbing and phase information comprises; a splitting element for splitting spatially an X-ray, a detector for detecting intensities of the X-rays transmitted through an object, the intensity of the X-rays changing according to X-ray phase and also position changes, and an calculating unit for calculating an X-ray transmittance image, and an X-ray differential phase contrast or phase sift contrast image as the phase information. The X-ray is split into two or more X-rays having different widths, and emitted onto the detector unit. And, the calculating unit calculates the X-ray absorbing and phase information based on a difference, between the two or more X-rays, in correlation between the changing of the phase of the X-ray and the changing the intensity of the X-ray in the detector unit.

X-ray apparatus and X-ray measuring method

An X-ray imaging apparatus and an X-ray imaging method for use in the X-ray imaging apparatus are provided. The X-ray imaging apparatus includes a separating element configured to spatially separate an X-ray generated by an X-ray generator unit and a scintillator array including a plurality of first scintillators arranged therein, where the separated X-rays are made incident on the first scintillators. Each of the first scintillators is configured to vary an intensity of fluorescence induced by the X-ray in accordance with an incident position of the X-ray. The X-ray imaging apparatus further includes a detector configured to detect the intensity of fluorescence emitted from the scintillator array.

X-ray imaging apparatus and X-ray imaging method

An X-ray imaging apparatus and an imaging method capable of acquiring an image of a test object associated with a phase shift in consideration of X-ray absorption is provided. A splitting element configured to spatially split an X-ray into multiple X-ray beams is provided. A shielding unit including a plurality of shielding elements configured to block part of an X-ray acquired by the splitting element is provided. Part of X-ray beams detected at the first detection pixels is blocked by the shielding elements. The X-ray beams detected by the second detection pixels adjoining the first detection pixels are not blocked by the shielding elements.

X-ray imaging apparatus and imaging method

The invention is aimed to provide an X-ray imaging apparatus and the like ensuring a sufficient range of detecting the amount of X-ray movement with respect to the pixel size of a detector in comparison with the method disclosed in International Publication No. WO2008/029107. The X-ray imaging apparatus of the present invention has a splitting element which spatially linearly splits an X-ray beam; and a shielding unit which shields a part of the X-ray beam which is split by the splitting element and whose position is changed by a test object. The shielding unit has a region transmitting X-rays and a region having a shielding element shielding (blocking) X-rays. A dividing line between the X-ray transmitting region and the region having the shielding element is configured to be arranged obliquely so as to cross the linearly split X-ray beam.

To provide an X-ray imaging apparatus capable of easily adjusting the sensitivity or capable of easily extracting the amount of refraction of X-rays. An X-ray imaging apparatus irradiating an object to be measured with an X-ray beam from an X-ray source that generates X-rays of a first energy and X-rays of a second energy different from the first energy to measure an image of the object to be measured includes an attenuator and a detector. The attenuator attenuates the X-ray beam transmitted through the object to be measured and is configured so as to vary the amount of attenuation of the X-rays depending on a position on which the X-ray beam is incident. The detector detects the X-ray beam transmitted through the attenuator and is configured so as to detect the X-rays of the first energy and the second energy.

X-ray imaging apparatus

An X-ray imaging apparatus acquiring a differential phase contrast image of a test object without using a light-shielding mask for X-ray. The apparatus includes an X-ray source, a splitting element configured to spatially divide an X-ray emitted from an X-ray source and a scintillator configured to emit light when a divided X-ray beam divided at the splitting element is incident on the scintillator. The apparatus also includes a light-transmission limiting unit configured to limit transmitting amount of the light emitted from the scintillator and a plurality of light detectors each configured to detect the amount of light that has transmitted through the light-transmission limiting unit. The light-transmission limiting unit is configured such that a light intensity detected at each of the light detectors changes in response to a change in an incident position of the X-ray beam.

There is provided a glass composition containing an oxide containing Lu, Si, and Al, in which the composition of the glass composition lies within a compositional region of a ternary composition diagram of Lu, Si, and Al in terms of cation percent, the compositional region being defined by the following six points:

Glass composition and optical device

Provided is an X-ray imaging apparatus and an X-ray imaging method that offer an alternative for a refraction contrast method. A first scintillator and a second scintillator are used, the first scintillator generating first fluorescent light when X-rays separated by the separating element are incident thereon, and a second scintillator generating second fluorescent light when X-rays separated by the separating element are incident thereon. The second scintillator has a fluorescence emission intensity gradient such that an amount of emitted fluorescent light changes in accordance with a change in a position at which the X-rays are incident.

Provided is an X-ray imaging apparatus and a method of X-ray imaging, with which the apparatus can be reduced in size and a with which differential phase image or a phase image with consideration of an X-ray absorption effect of an object can be obtained. A displacement of X-rays that have been split by a splitting element and have passed through an object is measured. The displacement can be measured by using a first attenuation element having a transmission amount that continuously changes in accordance with the incident position of X-rays. At this time, an X-ray transmittance of an object that is calculated by using a second attenuation element having a transmission amount that does not change in accordance with the incident position of X-rays is used.

X-ray imaging apparatus and method of X-ray imaging

Provided is an X-ray imaging apparatus and a method of X-ray imaging, with which the apparatus can be reduced in size and a differential phase image or a phase image with consideration of an X-ray absorption effect of an object can be obtained. X-rays are spatially split, and a first attenuation element in which the transmission amount of X-rays continuously changes in accordance with the displacement when the X-rays pass through an object is used. Transmittance is calculated by using the first attenuation element and a second attenuation element that is different from the first attenuation element with respect to an amount of change or a characteristic of change in the transmission amount of X-rays in a direction of a displacement of the X-rays. A differential phase image and the like of the object are calculated using the transmittance.

An X-ray imaging apparatus for obtaining information on a phase shift of an X-ray caused by an object comprises: an splitting element for splitting spatially an X-ray emitted from an X-ray generator unit into X-ray beams; an attenuator unit having an arrangement of attenuating elements for receiving the X-ray beams split by the splitting element; and an intensity detector unit for detecting intensities of X-ray beams attenuated by the attenuator unit; and the attenuating element changing continuously the transmission amount of the X-ray depending on the X-ray incident position on the element.

An X-ray imaging apparatus and an X-ray imaging method can alleviate the influence of scattered X-rays relative to the obtained image. A differential phase contrast image or a phase contrast image of a detection object is computed by using a splitting element and an exposure control unit that synchronizes the X-ray scanning speed and the image acquisition speed of a detecting unit.

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Atsugi, Japan

Taihei Mukaide