Anritsu Corporation

Taichi Murakami

Ryota Takasu

Yasuhiro Miyake

Shinji Morimoto

Masayuki Shinohara

Motohiro Banno

Tomohide Yamazaki

An object of the present disclosure is to provide a loss analysis device and a loss analysis method of detecting an event with high reproducibility when an SN ratio is small or when an event interval is short. According to the present disclosure, a loss analysis device includes an OTDR waveform acquisition unit that acquires an OTDR waveform of a measurement target optical fiber, and a calculation unit that performs nonlinear fitting of an event model function to the OTDR waveform and calculates a position of a start point of each event included in the OTDR waveform, a level at the start point of each event, a loss of each event, and a return loss of each event, the event model function using the position, the level, the loss, and the return loss as parameters.

Loss analysis device and loss analysis method

An object of the present disclosure is to improve an SN ratio while maintaining a distance resolution and to accurately detect an event occurrence location. An event detection device according to the present disclosure includes: an OTDR waveform acquisition unit that acquires an OTDR waveform of an optical fiber to be measured; a feature quantity extraction unit that performs wavelet transform on the OTDR waveform and generates a scalogram with each wavelet coefficient as a feature quantity; a peak extraction unit that calculates a noise threshold value from the OTDR waveform, and extracts a peak from the feature quantity on the scalogram based on the noise threshold value to generate a peak graph; and an event identification unit that identifies an event in the optical fiber to be measured from the peak graph.

Event detection device and event detection method

Provided are an optical spectrum analyzer and a pulse-modulated light measurement method capable of measuring pulse-modulated light even when a pulse-on time and a pulse period of the pulse-modulated light are unknown. Pulse-modulated light (DUT) is incident on a diffraction grating. A first light receiving unitreceives the 0th-order light of diffracted light diffracted by the diffraction grating. A second light receiving unitreceives diffracted light of an order other than the 0th-order light. A measurement timing signal generation unitgenerates a sampling signal based on the 0th-order light received by the first light receiving unit. The spectrum of the diffracted light received by the second light receiving unit is measured based on the sampling signal generated by the measurement timing signal generation unit.

Optical spectrum analyzer and pulse-modulated light measurement method

It is possible to allow a user to easily distinguish between an event at a place to be resolved and an event at a place having no problem on a path of a PON communication network to be measured. A light intensity distribution of return light is processed in a time-series order to detect an event at each position on a network. A parameter Nrelating to the total number of splitters present on a path of the network is specified, the number Nof detections of the total number of splitters detected as an event is recognized, and in a case where 'N&#x3e;N', a last detected event is associated with one optical splitter and is further displayed as an 'uncertain splitter' in distinction from a normal splitter.

OTDR measurement apparatus and control method

An optical spectrum analyzer is provided that can separate measurement target light into orthogonal polarization components and perform measurement and enable optical spectrum measurement that does not depend on polarization of the measurement target light. Measurement target light is separated into two orthogonal polarization components, the two polarization components whose position is shifted in an engraved line direction of a diffraction grating are incident on the diffraction grating, diffracted light of the two polarization components emitted from the diffraction grating is condensed, and the condensed diffracted light is incident on an incident side end surface of a 2-core ferrule with the two polarization components adjacent to each other.

Optical spectrum analyzer

An optical time domain reflectometer includes: a storage unit that stores in advance a fourth backscattered light level P(W) obtained by adding a difference &#x394;Pbetween a second backscattered light level P(W) which is measured using a first pulse width Wand a third backscattered light level P(W) which is measured using a second pulse width Wto a first backscattered light level P(W) at a connection point Dto a measurement target optical fiber which is measured using the first pulse width so as to be associated with the second pulse width; and an arithmetic processing unit that reads the fourth backscattered light level P(W) at the second pulse width corresponding to a pulse width of an optical pulse output from a light source to the measurement target optical fiber from the storage unit and calculates a transmission loss Lin the measurement target optical fiber.

Optical time domain reflectometer and testing method of optical time domain reflectometer

An end face inspection apparatus which inspects an end face of an test object, and includes optical system causing an image acquisition unit to form an image of an end face of a held test object, focusing degree changing means for changing a distance between the end face of the test object and a focal position of the optical system, and a control unit processing image data acquired in the image acquisition unit. The end face inspection apparatus acquires a series of image data which is output from the image acquisition unit at a preset time interval while the distance between the end face of the test object and the focal position of the optical system is changed, determines whether or not each piece of the image data is focused, and selects focused image data as image data for end face inspection.

End face inspection apparatus and focused image data acquisition method

An optical time domain reflectometer includes: an OTDR measurement unit; an event detection unit that detects an event using the measurement result of the OTDR measurement unit; a display unit that displays a plurality of icons indicating events in an event display region Aand displays information of an event, which is located in a specific region Aof the event display region A, in an information display region A; an operation detection unit that detects a swipe operation in the event display region A; and an event-of-interest changing unit that scrolls the events displayed in the event display region Aaccording to the swipe operation to change the display of the information display region Ato information corresponding to the event indicated by the icon located in the specific region A.

Growing community of inventors

Kanagawa, Japan

Taichi Murakami