Murata Manufacturing Co., Ltd.

Taichi Mori

Gaku Kamitani

Satoshi Kageyama

Naoki Fujii

Hiroshi Tomohiro

A likely value is calculated by a maximum-likelihood method for all coefficients of a relative error correction circuit network model derived by assuming that, for all pairs of two ports selected from among signal line ports related to application or detection of a high frequency signal and non signal line ports other than the signal line ports, there exists a leak signal directly transferred between the ports. A coefficient of a first relative error correction circuit network submodel derived by assuming that, for all pairs of two ports selected only from among signal line ports, there exists a leak signal directly transferred between the ports, and a coefficient for a non signal line port of a second relative error correction circuit network submodel derived by assuming that there exists a signal reflected at a non signal line port are used as initial values.

Measurement error correction method and electric component property measurement device

A first S parameter of a first circuit network including an input port and a connection port is prepared, a second S parameter of a second circuit network is measured, and an overall S parameter of an overall circuit network is calculated. The S parameter of the overall circuit network is calculated as the overall S parameter corresponding to the input port among virtual S parameters of a virtual overall circuit network in which the connection port of the virtual first circuit network is connected with the second circuit network, by using, as an unknown value, a parameter corresponding to the dummy port among virtual T parameters of a virtual first circuit network obtained through conversion of the first circuit network into a symmetric circuit network by adding a dummy port to the input port side of the first circuit network.

Method of deriving S parameter of electric circuit network

A method for correcting measurement errors and an electronic component characteristics measurement device improve correction precision by eliminating correction errors caused by leakage signal components between ports of the measurement jigs. An equation that correlates measurement values in a test measurement jig mounted state with measurement values in a standard measurement jig mounted state is determined from a result of measuring electrical characteristics of correction data obtaining samples having different electrical characteristics from each other in a state in which they are mounted on a standard measurement jig and on a test measurement jig. The equation is an equation that assumes the presence of leakage signals that are directly transmitted between at least two ports of at least one of the standard measurement jig and the test measurement jig. By using the equation determined by measuring the electrical characteristics on an arbitrary electronic component in a state in which it is mounted on the test measurement jig, the electrical characteristics that would be obtained if measured on the electronic component in a state in which it is mounted on the standard measurement jig are calculated.

Method for correcting measurement errors and electronic component characteristics measuring device

An electronic-component high-frequency characteristic error correcting method for allowing a calibration work to be performed on a two-terminal impedance component using the same correction-target measuring system as that used in actual measurement. At least three correction data acquisition samples having different high-frequency characteristics are measured by a reference measuring system and an actual measuring system. An equation for associating the value measured by the actual measuring system with the value measured by the reference measuring system using an error correction coefficient of a transmission line is determined. A given electronic component is measured by the actual measuring system. An estimated high-frequency characteristic value of the electronic component obtained when the electronic component is measured by the reference measuring system is calculated using the determined equation.

Method for correcting high-frequency characteristic error of electronic component

A measurement error correcting method and electronic component characteristic measuring device capable of accurately coping with an electronic component which includes nonsignal line ports and whose electrical characteristics are changed by a jig. The method includes the steps of measuring an electrical characteristic, with correcting-data-acquisition samples mounted on a test jig enabling measuring nonsignal line ports, and the samples mounted on a reference jig; measuring a through device in which a signal line port and a nonsignal line port are electrically connected to each other; determining a numerical expression for calculating, from results of measurement on the test jig, an estimated electrical characteristic value obtained on the reference jig; measuring an arbitrary electronic component, on the test jig; and calculating the estimated electrical characteristic value obtained on the reference jig.

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Yasu, Japan

Taichi Mori