Korea Advanced Institute of Science and Technology

Taeyong Chang

Jonghwa Shin

Joonkyo Jung

An optical measurement device according to an aspect of the present disclosure includes a universal metasurface on which light is incident, a polarization sensor configured to measure a polarization state of light passing through the universal metasurface, and a controller configured to collect a quantitative differential interference contrast (QDIC) image for the x polarization of incident light that is collected by the polarization sensor, a QDIC image for y polarization, and a quantitative relative phase (QRP) image representing a relative phase difference between the x polarization and y polarization and configured to calculate intensity, a phase or polarization information of the incident light.

Optical measurement device with universal metasurface and optical measuring method using the same

The present disclosure provides a planar metalens and a cover glass including the planar metalens.

Growing community of inventors

Daejeon, South Korea

Taeyong Chang