Samsung Corning Precision Materials Co., Ltd.

Samsung Corning Precision Material Co., Ltd.

Taeho Keem

Misun Kim

Siho Seong

Chang Ha Lee

Hun Sang Jung

Hun Sik Lee

Hyun Woo Kim

Hyung Sang Roh

Changha Lee

YoungJoong Kim

Hyun-Woo Kim

Hyun-woo Kim

Hyunwoo Kim

So-ra Yu

Youngchae Ko

Taekmin Kwon

Gahyun Kim

Sungjong Pyo

So-Ra Yu

An apparatus for measuring the transmittance of a piece of cover glass for a photovoltaic cell which can measure an accurate transmittance irrespective of whether or not the cover glass has a pattern and irrespective of the shape of the pattern. The apparatus includes a light source part disposed in front of the piece of cover glass. The light source part directs light into the piece of cover glass. A detector is disposed in the rear of the piece of cover glass, and detects light that has been directed into the piece of cover glass and then has passed through the piece of cover glass. The detector is disposed within a range where the intensity of the light that has passed through the piece of cover glass is uniform.

Apparatus for measuring transmittance of cover glass for photovoltaic cell

An apparatus for detecting a foreign substance on an interleaving paper to be inserted between glass substrates, in which the process of detecting the foreign substance on the paper is automated to improve the detection efficiency. The apparatus includes a paper-loading unit and a paper-inspecting unit configured to be connected to the paper-loading unit. The paper-inspecting unit detects a foreign substance on a surface of the paper loaded by the paper-loading unit. The apparatus also includes a paper-unloading unit, which is configured to be connected to the paper-inspecting unit, and unloads the paper from the paper-inspecting unit and then stacks the paper. The apparatus also includes a controller, which controls the paper-loading unit, the paper-inspecting unit and the paper-unloading unit to transfer the paper, and controls the paper-inspecting unit to detect the foreign substance.

Apparatus for detecting a foreign substance on an interleaving paper to be inserted between glass substrates

The present invention relates to an apparatus for detecting particles in flat glass and a detecting method using the same. The present invention provides an apparatus for detecting particles in flat glass, comprising: an illumination unit which is installed in one region selected from upper and lower regions on the basis of flat glass; a first polarizer which is installed between the illumination unit and the flat glass, and has a first polarization direction; a first camera and a second camera which are installed in the opposite direction where the illumination unit is installed on the basis of the flat glass; a second polarizer which is equipped in a space between the first camera and the flat glass, and has a polarization direction in the range of 0&#xb0; to 20&#xb0; that is different from the polarization direction of the first polarizer; a fourth polarizer which is equipped in a space between the second camera and the flat glass, and has a polarization direction in the range of 70&#xb0; to 90&#xb0; that is different from the polarization direction of the first polarizer; and a processor which receives images obtained from the first camera and the second camera, and decides whether defects are benign particles or malignant particles.

Apparatus for detecting particles in flat glass and detecting method using same

Glass substrate cutting apparatuses using lasers are disclosed, where a laser cutting head is moved. A glass substrate cutting apparatus includes two parts for a laser cutting head: heavy laser beam generators fixed to respective ends of a gantry structure moving in parallel along two gantry stages located on either side of a cutting table, and relatively lightweight laser irradiation heads moving horizontally in parallel with the gantry structure. The glass substrate cutting apparatus includes a cutting table for maintaining a glass substrate in a horizontal state; biaxial gantry stages for moving a gantry structure along the cutting table; the gantry structure moving in between an upper part of the biaxial gantry stages; laser beam generators fixed to respective ends of the gantry structure for oscillating the laser; and laser irradiation heads that move horizontally on respective ends of the gantry structure and irradiate the laser upon the glass substrate.

Glass substrate cutting apparatus and glass substrate cutting system using the same

Disclosed herein are apparatuses for breaking a glass panel unified with a process table which break the glass panel formed with scribing lines along the scribing lines by irradiating laser beams. The apparatuses for breaking a glass panel unified with a process table to conduct breaking operations of the glass panel after scribing work of the glass panel as one body with the process table are installed on both sides of the process table included in a transfer-type cutting head laser cutting device. Each apparatus for breaking the glass panel unified with the process table comprises: breaking bars for cutting the glass panel by applying pressure to cutting sections of the glass panel; rotating devices for rotating the breaking bars by combining with both ends of the breaking bars; and a support equipped with cylinders for vertically moving the rotating devices in both sections.

Apparatuses for breaking a glass panel unified with a process table

The present invention relates to an apparatus for detecting particles on a glass surface and a method thereof, and more specifically, to an apparatus for detecting particles on a glass surface and a method thereof for exactly inspecting particles which may be created on a glass surface where micro circuits are deposited. The apparatus for detecting the particles on the glass surface in accordance with the present invention comprises laser beam irradiators for detecting particles on a glass substrate on upper and lower sides of the glass substrate at certain intervals, respectively, and wherein the irradiators are configured so that beams emitted from the laser beam irradiators can be irradiated in a direction vertical to a transferring direction of the glass substrate, thereby exactly detecting particles detached to the glass surface without exception.

Apparatus for detecting particles on a glass surface and a method thereof

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Chungcheongnam-do, South Korea

Taeho Keem