Kabushiki Kaisha Toshiba

Tadatoshi Ishii

Hideki Ito

Ken Ishii

Tetsuya Kitamura

Ena Ishii

Mikito Iwamasa

Toshiaki Shirasuna

Takeo Arafune

Akiyasu Yamamoto

Yuichi Sekizawa

According to one embodiment, an electric-vehicle testing apparatus includes processing circuitry. The circuitry generates a first signal corresponding to accelerator operation amount and a second signal corresponding to brake operation amount in accordance with test conditions. The circuitry controls torque of a test motor included in a test object. The circuitry computes running resistance to be assumed using a rotation speed of the test motor. The circuitry computes braking force using the second signal and an actual vehicle speed obtained from the rotation speed of the test motor. The circuitry controls torque of a load motor coupled to the test motor, based on a second command value corresponding to the running resistance and the braking force.

Electric-vehicle testing device and method

A movability determining section checks the movability of an descriptive element comprised in a specification having a hierarchical structure. The descriptive element of which the movability is checked is moved in the hierarchical structure by a specification moving section. For the movement, a preparation is made as follows. The specification moving section, if necessary, moves a communication channel included in the descriptive element to make sure that a constraint with respect to the level to which the communication channel belongs is satisfied after the movement. After the preparation, the specification moving section moves a behavior included in the descriptive element upward/downward across levels in the hierarchical structure. A specification correcting section corrects the specification so as not to violate an execution order constraint.

Method and computer program product for operating a specification of a system

A one-chip fuzzy processing apparatus is constituted by integrating a grade calculation circuit for obtaining the grades of IF part membership functions corresponding to a variable value, a THEN part membership function generator for generating THEN part membership functions, a combining circuit for modifying the THEN part membership functions, and combining the modified membership functions, and a defuzzify circuit for defuzzifying the output from the combining circuit. The combining circuit includes a circuit for obtaining a minimum value of grades of the IF part membership functions for each fuzzy rule, a circuit for comparing an obtained minimum value with a THEN part membership function for each fuzzy rule to cut a peak of the THEN part membership function, and a maximum processor for combining the THEN part membership functions by obtaining a maximum value of the modified THEN part membership functions. The defuzzify circuit includes a circuit for obtaining a center of gravity of the membership function combined by the combining circuit. The THEN part membership function generator is constituted by a counter, and a circuit for sequentially outputting the grades of the THEN part membership functions using the count values from the counter as x-coordinate values.

Fuzzy rule-based system formed on a single semiconductor chip

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Tokyo, Japan

Tadatoshi Ishii