Sharp Kabushiki Kaisha Corporation

Other

Kanto Denka Kogyo Co., Ltd.

Sharp Kabuskiki Kaisha

Nobuyoshi Koshida

Tadashi Iwamatsu

Hiroyuki Hirakawa

Nobuyuki Azuma

Tetsuro Toyoshima

Ayae Nagaoka

Yasuo Imura

Yoshinori Mutou

Kohji Shinkawa

Takayuki Yamanaka

Yoshinori Nakajima

Takanori Kamoto

Nobuyuki Yoshioka

Shohei Komaru

Masanori Yamada

Osamu Wada

Mai Takasaki

Katsumi Adachi

Atsushi Inoue

Hiroshi Tatsumi

Toshihiro Kaneko

Tokio Taguchi

Kazuhiro Matsuyama

Tohru Okuda

Kenichiro Nakamatsu

Toshihiko Takaya

Hirofumi Kanda

Katsuhiko Kyuhken

Hiroshi Ishii

Hidekazu Hayashi

Kiyoshi Toizumi

Taisuke Kamimura

Takashi Hara

Tomohiro Kosaka

Yoshinori Mutoh

Kazuya Tsujino

Shigeru Nishio

Hiroyuki Sawai

Atsushi Niinoh

Kazuhiko Furukawa

Masamitsu Sakuma

Shigemi Asai

Fumiaki Sugimori

Chika Hirakawa

Shunji Nakai

Keiji Yasuda

Kenji Mishima

Kanako Hirata

Yoshio Ichii

Reshan Maduka Abeysinghe

Tetsuya Inui

Haruo Yamamoto

Hideaki Fujita

Toshihiro Tamura

Eiichi Kido

Hiroyuki Yamaji

Hiroyuki Hanato

Yukihito Nishio

Shigeaki Kakiwaki

Takashi Sakai

Satoshi Morimoto

Chiaki Yamawaki

Yasuhiro Sakamoto

Masatomo Hayashi

Masamitsu Moritani

Masanobu Furukawa

Tetsuyuki Ueda

Shuji Matsusaka

Hiroaki Masuda

Yuhsuke Ebata

Natsuki Matsuura

Tetsurou Toyoshima

Nobuhiro Seki

Shunsuke Matsuo

The present disclosure provides an IMS analyzer including an analysis chamber, an electron emitter, an ion detector, a first gas injector that injects a sample gas into the analysis chamber, a second gas injector that injects a drift gas into the analysis chamber, a third gas injector that injects a primary ion generating gas into the analysis chamber, and an outlet port, in which the first gas injector, the second gas injector, the third gas injector, and the outlet port are arranged such that the sample gas merges with the drift gas and the primary ion generating gas in a reaction area and is discharged through the outlet port, the ion detector is located on an upperstream side of the drift gas stream relative to the reaction area, and the electron emitter is located on an upperstream side of the primary ion generating gas stream relative to the reaction area.

IMS analyzer

An ion generation apparatus according to the present invention includes an electron emission device, an opposite electrode, and a controller, the electron emission device includes a lower electrode, a surface electrode, and an intermediate layer provided between the lower electrode and the surface electrode, the opposite electrode is provided to be opposite to the surface electrode, and the controller is provided to apply a voltage to the surface electrode, the lower electrode, or the opposite electrode such that a potential of the surface electrode becomes higher than a potential of the lower electrode and a potential of the opposite electrode in a positive ion mode.

Ion generation apparatus and ion mobility analysis apparatus

The electron capture detector () is a device for detecting a sample (α). The electron capture detector () includes a detection cell (), a sample inlet (), and an electron emitting element (). The detection cell () forms a reaction chamber (). The sample inlet () introduces a first carrier gas containing the sample (α) into the reaction chamber (). The electron emitting element () emits electrons (β) into the reaction chamber (). An ion (α) derived from the sample component is generated as a result of the electron emitting element () emitting electrons (β) into the reaction chamber ().

Electron capture detector

An analysis device includes an electron emission element, a collector, an electric field former, a power source, and a controller. The electron emission element includes a bottom electrode, a surface electrode, and an intermediate layer arranged between the bottom electrode and the surface electrode. The power source and the controller allow application of a voltage between the bottom electrode and the surface electrode. The electric field former forms an electric field in an ion movement region where anions directly or indirectly generated by electrons emitted from the electron emission element move toward the collector. The collector and the controller allow measurement of a current waveform of an electric current made to flow by arrival of anions at the collector. The controller regulates, based on the current waveform, a voltage applied between the bottom electrode and the surface electrode.

Analysis device

This electron emitting element includes a lower electrode, a surface electrode facing the lower electrode, a resistance layer arranged between the lower electrode and the surface electrode, and an insulating layer arranged between the lower electrode and the surface electrode. The resistance layer is an insulating resin layer containing conductive fine particles in a dispersed state. The insulating layer has a peripheral region for defining the electron emission region, and an emission control region which is arranged so as to overlap the electron emission region defined by the peripheral region. The emission control region is configured by a line-shaped insulating layer, a plurality of dot-shaped insulating layers, or both a line-shaped insulating layer and a plurality of dot-shaped insulating layers. The percentage of an area that the emission control region represents within an area of an electron emission region defined by the peripheral region is 2% or more and 60% or less.

Electron emitting element

The present invention provides a cell stimulation device capable of uniformly electrically stimulating cells intended to be electrically stimulated, and of preventing medium components from decomposing and depositing. [Solution] The cell stimulation device according to the present invention is intended to stimulate the cells being cultured in a culture medium, and is characterized in that the cell stimulation device includes an electron emission element for feeding electric charges to the culture medium via a gas phase, and an electric charge collecting electrode for collecting the electric charges from the culture medium, the electron emission element includes a lower electrode, a surface electrode, and an intermediate layer disposed between the lower electrode and the surface electrode, and the electric charge collecting electrode is disposed so as to be contactable with the culture medium.

Cell stimulation device, cell culture device, and cell stimulation method

An analyzer according to the present invention includes an electron emission element, a detector, an electric field generator, an electrostatic gate electrode, and a controller, in which the electron emission element includes a lower electrode, a surface electrode, and an intermediate layer, and directly or indirectly generates anions by electrons emitted in an ionization region between the electron emission element and the electrostatic gate electrode, the electrostatic gate electrode controls injection of the anions into a drift region between the electrostatic gate electrode and the detector, the detector detects the anions move through the drift region by a potential gradient, and the controller applies a pulse voltage between the lower electrode and the surface electrode, and applies a voltage to the electrostatic gate electrode such that the electrostatic gate electrode injects the anions into the drift region during a time when the pulse voltage is on.

Analyzer

An electron emission element of the present invention includes a lower electrode, a surface electrode, and a silicone resin layer disposed between the lower electrode and the surface electrode, wherein the surface electrode includes a silver layer, and the silver layer is in contact with the silicone resin layer.

Electron emission element and method for manufacturing same

An analysis apparatus includes an ionization section, an ion separation section, and an ion detection section. The ionization section generates one or more sample component-derived ions. The ion separation section separates the ions in accordance with mobility of the ions. The ion detection section detects the ion which passes through the ion separation section. The ionization section includes a reaction chamber and an electron emission element. A sample is introduced to the reaction chamber. The electron emission element emits an electron to the reaction chamber.

Analysis apparatus

An electron emitting device () includes a first electrode (), a second electrode (), and a semi-conductive layer () provided between the first electrode () and the second electrode (). The semi-conductive layer () includes a porous alumina layer () having a plurality of pores () and silver () supported in the plurality of pores () of the porous alumina layer ().

Electron emission element and method for same

An electron emission element () includes a first electrode () and a second electrode () which are arranged facing each other, an intermediate layer () that is provided between the first electrode () and the second electrode (), and an insulating layer () that is formed with a thickness don a substrate (). A level difference between the insulating layer () and the first electrode () is smaller than the thickness dof the insulating layer ().

Electron emission element, electrification apparatus, and image forming apparatus

A method of producing an electron emitting device includes: step A of providing an aluminum substrate or providing an aluminum layer supported by a substrate; step B of anodizing a surface of the aluminum substrate or a surface of the aluminum layer to form a porous alumina layer having a plurality of pores; step C of applying Ag nanoparticles in the plurality of pores to allow the Ag nanoparticles to be supported in the plurality of pores; step D of, after step C, applying a dielectric layer-forming solution onto substantially the entire surface of the aluminum substrate or the aluminum layer, the dielectric layer-forming solution containing, in an amount of not less than 7 mass % but less than 20 mass %, a polymerization product having siloxane bonds; step E of, after step D, at least reducing a solvent contained in the dielectric layer-forming solution to form the dielectric layer; and step F of forming an electrode on the dielectric layer.

Electron emission device and method for manufacturing the same

Provided are an electron emission device having a novel structure and being capable of improving characteristics and/or extending a lifetime of a related-art electron emission device, and a method of manufacturing the electron emission device. The method of manufacturing an electron emission device includes: a step A of providing one of an aluminum substrate and an aluminum layer supported by a substrate; a step B of anodizing a surface of the one of the aluminum, substrate and the aluminum layer to form a porous alumina layer having a plurality of pores; a step C of applying silver nanoparticles into the plurality of pores to cause the plurality of pores to support the silver nanoparticles; a step D of applying, after the step C, an insulating layer forming solution to substantially an entire surface of the one of the aluminum substrate and the aluminum layer; a step E of forming, after the step D, an insulating layer by at least reducing a solvent included in the insulating layer forming solution; and a step F of forming an electrode on the insulating layer.

Electron emission device, method for manufacturing same, and method for manufacturing electronic device

An electron emitting device includes a lower electrode, a surface electrode, an electron acceleration layer between the lower electrode and the surface electrode, and an electrode selecting unit. The electron acceleration layer is made of at least an insulating material. At least one of the lower electrode and the surface electrode is a stripe-pattern electrode including a plurality of unit electrodes that are regularly arranged. The electrode selecting unit sequentially selects, from among the plurality of unit electrodes, a unit electrode to which a voltage is to be applied. A voltage is applied between the lower electrode and the surface electrode to accelerate electrons between the lower electrode and the surface electrode, so that the electrons are emitted from the surface electrode.

Electron emitting device with electron acceleration layer containing conductive microparticles

A two-component developer is provided. The two-component developer includes a toner containing a binder resin, a colorant and a release agent, and a resin-coated carrier composed of a carrier core material and a resin coating layer formed on a surface of the carrier core material. The toner has an exposure rate of the release agent on the toner surface of 1.00% or above and 3.07% or below. The carrier core material has an apparent density of 1.86 g/cmor more and 2.45 g/cmor less. The exposure rate of the release agent of the toner and the apparent density of the carrier core material satisfy the following formula (1):&#x2266;&#x2212;1.54+5.93&#x2003;&#x2003;(1)wherein y represents the exposure rate of the release agent of the toner, and x represents the apparent density of the carrier core material.

Two-component developer, developing device, image forming apparatus, and image forming method

Growing community of inventors

Nara, Japan

Tadashi Iwamatsu