Nec Electronics Corporation

Tadashi Fukase

Manabu Iguchi

Akira Matsumoto

Masahiro Komuro

Akira Matumoto

In a semiconductor device, a circuit unit is formed in an inside portion, and seal rings that enclose the inside portion that are composed of walls of metal layers are formed around the periphery. In the corners, the seal rings include linear parts that extend inwardly in addition to the linear parts that extend along the periphery, whereby the seal rings are formed in a planar pattern having small rectangular planar patterns in each corner.

Semiconductor device having superior resistance to moisture

In the semiconductor device of the present invention, a plurality of dummy patterns are formed in a grid arrangement in the scribe line areas of a wafer, and a plurality of dummy patterns are formed in a diagonally forward skipped arrangement in the chip interior areas of the wafer. Altering the arrangement of dummy patterns in the chip interior areas and scribe line areas in this way enables formation of dummy patterns with greater uniformity in the chip interior areas and enables formation of dummy patterns with greater resistance to loss that occurs when dicing in scribe line areas.

Growing community of inventors

Kawasaki, Japan

Tadashi Fukase