Anritsu Corporation

Tadanori Nishikobara

Keita Masuhara

Takashi Murakami

Ken Mochizuki

Kazuhiko Ishibe

Eiji Takeda

Osamu Sugiyama

Yohei Niki

Katsuyuki Yaginuma

A measurement parameter input control method and a measurement parameter input control device are provided which can intuitively change measurement parameters, which are set for a target device and are necessary for various measuring processes, with high operability. The measurement parameter input control device includes: a parameter processing section that acquires measurement parameter information including measurement parameters from a target device and that rewrites changed parameters which are measurement parameters after the changing to the target device; a parameter identifying section that identifies the types of the parameters in the acquired measurement parameter information and outputs soft key constructing information for constructing a parameter setting soft key based on the identified measurement parameter information, a display control section that includes a soft key controller displaying and controlling the parameter setting soft key based on the measurement parameter information on a display screen of a display unit on the basis of the soft key constructing information from the parameter identifying section; and an input unit that operates the parameter setting soft key displayed on the display unit.

Measurement parameter input control device and measurement parameter input control method

When an operating unit is operated to designate an arbitrary width W and an arbitrary angle &#x3b8;, a mask region limiting unit limits the effective range of a reference mask set for compliance measurement of the data signal to be evaluated by a reference mask setting unit to the range determined by the designated width and angle and displays the limited effective range on a display unit. When the mask region limiting unit limits the effective range of the reference mask, a quality evaluating unit performs compliance measurement and quality evaluation for the limited effective range in operative association with the limitation of the effective range.

Data signal quality evaluation apparatus

A jitter generation apparatus for applying a phase modulation to a PLL is controlled by a control unit so as to output a signal with the desired jitter based on a parameters. When a switching unit is switched to a first state, the control unit controls first and second level control units so that the desired jitter in which an amplitude of a first modulation signal matches the parameter is added to an output signal from a voltage controlled oscillator unit, and passes through a quadrature modulator. When the switching unit is switched to the second state, the control unit controls the first and second level control units so that a quadrature modulation is applied to a local signal, which is input to the quadrature modulator without adding any jitter to an output signal from the voltage controlled oscillator unit, and a quadrature-modulated local signal is output.

Jitter generation apparatus, device test system using the same, and jitter generation method

In order to stably measure an input interval time of a pulse signal with high precision, a time interval measuring apparatus includes a reference signal generator, a phase shifter, first and second A/D converters, an error correction unit, an instantaneous phase calculation unit, and an interval time calculation unit. The phase shifter divides a reference signal of a sine wave having a predetermined frequency from the reference signal generator into a first analog signal and a second analog signal having phases shifted to each other. The first and second A/D converters perform sampling of the first analog signal and the second analog signal from the phase shifter, respectively, at an input timing of a pulse signal to be measured, and output a first and second digital sample values. The error correction unit corrects direct current offset errors generated in, respectively, the first and second digital sample values output from the first and second A/D converters, a phase error with respect to 90&#xb0;, and an amplitude error. The instantaneous phase calculation unit calculates an instantaneous phase of the reference signal based on the corrected first and second digital sample values. The interval time calculation unit determines an input interval time of the pulse signal based on a variation of instantaneous phases.

Time interval measuring apparatus and jitter measuring apparatus using the same

A clock generating unit generates a clock signal having a predetermined frequency. A pattern generating unit outputs a data signal having a predetermined pattern in which one frame is configured from a predetermined bit length, so as to be synchronized with the clock signal. A waveform information acquiring unit receives the data signal as a data signal to be measured, and receives the clock signal, and acquires information of waveform in the same time domain of the data signal to be measured and the clock signal. An averaging processing unit carries out averaging processing on an acquired waveform. A phase difference detecting unit detects a phase difference of the data signal to be measured and the clock signal, for each bit, based on an averaged waveform information. A frequency band limiting processing unit carries out predetermined frequency band limiting processing on the per-bit phase difference information. A measured result outputting unit outputs the phase difference information as pattern dependent jitter.

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Atsugi, Japan

Tadanori Nishikobara