Toyama University

Tadahiro Echigo

Hiroyuki Okada

Hiroyoshi Onnagawa

Shigeki Naka

Miki Shibata

A method for measuring a relative thickness distribution of an organic thin film for use in an organic electroluminescence device comprises the steps of irradiating a predetermined region of the organic thin film with a light including an ultraviolet light, measuring the intensity of a fluorescence produced by the organic thin film in response to the light irradiation, and obtaining a film thickness of the predetermined region from the intensity of the fluorescence. Further, an apparatus for measuring a thickness distribution for use in an organic electroluminescence device has means for irradiating a predetermined region of the organic thin film with a light including an ultraviolet light, means for measuring the intensity of a fluorescence produced by the organic thin film, and means for obtaining the film thickness of the predetermined region from the intensity of the fluorescence.

Film thickness measuring method and measuring apparatus for organic thin film for use in organic electroluminesce device

A method of manufacturing an organic electroluminescent device has the steps of forming a first electrode on a substrate, preparing a solution containing a hole transport organic material, an electron transport organic material and a luminescent organic material, followed by spraying the solution onto the first electrode by using a pressurized gas so as to form an organic thin film layer, and forming a second electrode on the organic thin film layer.

Growing community of inventors

Uozu, Japan

Tadahiro Echigo