U.S. Philips Corporation

Koninklijke Philips Corporation N.V.

Taco Zwemstra

Augustus J Janssen

Johannes P M Van Lammeren

Gerardus P Seuren

Johannes Pm Van Lammeren

Marc T Looijer

The method for inspecting an integrated circuit comprising a plurality of sub-circuits includes the determination of the supply current into at least one of the sub-circuits. This supply current is determined, while the other sub-circuits are operational, by measuring the voltage over a segment of the supply line through which this supply current flows. This supply line contains no additional components to facilitate the measuring of the voltage.

Method and apparatus for inspecting and integrated circuit by measuring voltage on a signal line

A method for inspecting an integrated circuit having a plurality of sub-circuits includes the determination of the supply current into at least one of the sub-circuits. This supply current is determined, while the other sub-circuits are operational, by measuring the voltage over a segment of the supply line through which this supply current flows. This supply line contains no additional components to facilitate the measuring of the voltage.

Method for inspecting an integrated circuit by measuring a voltage drop in a supply line of sub-circuit thereof

The invention relates to a time domain method for obtaining transfer characteristics of a device under test (DUT). The method comprises the steps of applying a sine sweep and a cosine sweep to an input of the DUT, and measuring response signals at an output of the DUT. The sine sweep and cosine sweep together establish a complex input signal, whereby to each instant there is related a particular frequency. Similarly, the respective response signals together establish a complex response signal. The magnitudes and phases of both complex signals are calculated and the transfer characteristics of the DUT then follow from the magnitude ratio and the phase difference of the input signal and the response signal. The invention also relates to an arrangement for testing transfer characteristics of a DUT and to an integrated circuit comprising the necessary elements for testing a subcircuit contained therein.

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Nijmegen, Netherlands

Taco Zwemstra