Kabushiki Kaisha Toshiba

Syoichi Asoh

Masataka Matsui

Kazuhiko Hashimoto

A semiconductor device capable of performing a failure analysis includes a semiconductor substrate having a plurality of circuit elements, and an identification region provided above the semiconductor substrate so as to record identification information such as position information within wafers, information for wafer numbers, etc. The identification information is given by binary coded patterns, fused patterns of fuse elements, etc.

Semiconductor device having identification region for carrying out

A semiconductor device includes a main storage section for storing data. A spare storage section is disposed in association with the main storage section so as to serve as a redundancy circuit for replacing a deflection element of the main storage section. A temporary storage section is disposed in association with the main storage section to store the data temporarily. A comparator section makes a comparison between the data stored in the main storage section and the data stored in the temporary storage section to provide a comparison result. A switching section is responsive to the comparison result output from the comparator section to replace the defective element with the spare storage section.

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Oita, Japan

Syoichi Asoh