Commissariat a L'energie Atomique Et Aux Energies Alternatives

Sylvain Pouch

Lukasz Borowik

Nicolas Chevalier

A method determines the carrier lifetime in a point of a surface of a sample, and includes in absence of illumination, measuring, at the point, a parameter P via atomic force microscopy technique (AFM) to obtain a value P. The point is illuminated with a continuous light beam and the parameter P is measured, at the point, via AFM to obtain a value P. The point is successively illuminated with continuous modulated light beams each having a different frequency fthat varies between a minimum frequency fand a maximum frequency f, with the modulated light beams having a duty cycle D. For each modulated light beam, the parameter P is measured, at the point, via AFM in such a way as to obtain a value Pfor each frequency f. The carrier lifetime is calculated on point with the values of P, P, the duty cycle D, and f.

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Grenoble, France

Sylvain Pouch