Centre National De La Recherche Scientifique

Sorbonne Université

Commissariat a L'energie Atomique Et Aux Energies Alternatives

California Institute of Technology

University of Colorado

Université Paris Diderot-Paris 7

Ecole Superieure De Physique Et De Chimie Industrielles De La Ville De Paris

Paris Sciences Et Lettres-Quartier Latin

Ecole Normale Superieure De Paris

Fonds De L'espci-Georges Charpak

Sylvain Gigan

Gilles Tessier

Changhuei Yang

Arnaud Verdant

Rafael Piestun

Antoine Dupret

Laurent Daudet

Igor Carron

Kristina Irsch

Thomas Juffmann

Simon Labouesse

Yannick De Wilde

Giovanni Volpe

Lèo Greusard

François Ramaz

Samuel Gresillon

Andrés De Los Ríos Sommer

Kamel Bencheikh

Florent Krzakala

Angélique Dremeau

Alaa Saade

Giorgio Volpe

Andrés De Los RÍOS Sommer

Timothé Laforest

Systems and methods are provided for imaging and characterizing objects including the eye using non-uniform or speckle illumination patterns. According to the present technology, a method for characterizing at least a portion of an object may include generating, using at least one light source, one or multiple non-uniform illumination patterns on an object. The method may also include detecting, using a detector, backscattered light from the object in response to the generating. The method may further include extracting, using the detector, data representative of the backscattered light. The method may also include processing, using a processing unit, the data representative of the backscattered light to create one or more images of at least a portion of the object.

Systems and methods for imaging and characterizing objects including the eye using non-uniform or speckle illumination patterns

A device for phase microscopy is disclosed that comprises a spatial light modulator and a connecting means adapted to fix the spatial light modulator onto a phase microscope. The phase microscope comprises a light path comprising at least a sample area, a light device for lighting said sample area, and an imaging device for capturing a phase image of said sample area. The phase image is a 2D matrix of pixels. The spatial light modulator is positioned in the light path in a conjugated plane of the sample area. The device also comprises a command of the spatial light modulator connected to the imaging device and adapted to measure the phase shift of a plurality of pixels of the phase image and to command the spatial light modulator in order to subtract the measured phase shifts.

High sensitivity phase microscopy imaging

An integrated sensor and optical phase/amplitude modulator device including a modulator stacked on or above a detector. A circuit receives a signal outputted from the detector in response to an input field irradiating the detector. The circuit performs binary operations comprising classifying the input phase of the input electromagnetic radiation into one of two ranges and setting the modulator into one of two states depending on which range the input phase is classified into. The modulator transmits output electromagnetic radiation having an output field modulated according to the state of the modulator set by the circuit.

Concepts pertaining to integrated sensor and optical phase/amplitude modulator

An optical detection device includes a light source emitting a light beam whose electromagnetic field, a means adapted to divide the beam into a first beam defining a first reference pathway and a second beam defining a second sample pathway, a modulation system frequency-shifting the electromagnetic fields of the two beams, a beam coupler adapted to collect the beams, an optical detection system adapted to detect the signal arising from the interference between the beams and coupled via the coupler, the sample being placed in the sample pathway, the optical detection system comprising an optical detector and a device adapted to measure the amplitude and the phase of the signal, an opaque screen comprising an optical aperture is placed at the level of a zone of a sample, in proximity to the sample, in the sample pathway.

SNOM device using heterodyne detection

The invention is related to a digital-data mixing apparatus (), a data processing system () and an associated method for mixing digital-data. The digital-data mixing apparatus comprises, integrated in a housing (), input means () for receiving a plurality of bits (I. . . In) of input digital data (), electromagnetic emission means () for generating a modulated electromagnetic beam () wherein said input digital data () are converted in simultaneous modulations of the modulated electromagnetic beam (), electromagnetic scattering means () for scattering the modulated electromagnetic beam () in a scattered electromagnetic beam (), receiving means () for converting the scattered electromagnetic beam () in bits (O. . . Om) of output digital data (), and output means () for providing said output digital data ().

Digital-data mixing apparatus and digital-data processing system

The invention relates to a method for trapping particles contained in a fluid including at least the steps of generating a coherent light beam, diffusing the coherent light beam using a passive diffusive element to yield a diffused beam having a field of optical speckles, and causing the diffused beam to interact with a plurality of particles contained in a fluid.

Methods and device for trapping, moving and sorting particles contained in a fluid

The invention concerns a system for measuring and controlling the wave-front of a coherent light beam (), comprising: a device for generating a reference light beam () that is coherent with said coherent light beam (); a partially reflective monolithic device () comprising an array of elementary cells, each elementary cell comprising at least one element () for measuring a portion of the incident wave interfering between the coherent light beam and the reference light beam and a phase modulation element () for modulating the phase of the reflected beam; and a control device () for controlling said phase modulation element making use of the information from the associated measuring element.

Device for measuring and controlling the wave-front of a coherent light beam

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Paris, France

Sylvain Gigan