Seagate Technology Incorporated

Swee Tiong Tan

Chung Poh Ong

Kee Ann Chan

Shang Jiun Wong

Cheng Siong Chin

Ying W Wang

Jian Zhao

A testing apparatus for testing a device or components of a device is presented. It is desirable to simulate the effects of rotary and other forces as well as environmental factors on various components of devices to optimize design improvements so as to increase the quality of the various components and the device or to increase the length of service of the various components and the device.

Multi-axis test apparatus

A test device comprises a base and a first fixture coupled to the base. The first fixture holds a first portion of an electronic device mounted in the test device. The test device includes a second fixture rotatably coupled to the base and a lever coupled to the second fixture. The second fixture holds a second portion of the electronic device mounted in the test device. The test device also includes an actuator that forcibly moves the lever to rotate the second fixture and apply a torsion stress on the electronic device mounted in the test device. The test device may be used to test the functionality of electronic devices, such as small form-factor disc drives, while under torsion stresses.

Electronic device torsion testing

Growing community of inventors

Singapore, Singapore

Swee Tiong Tan