Hewlett-Packard Company

Suzie Dustin

John W Huffman

Michael Joseph Martin

Nancy Cernusak

In an imaging system including at least one imaging medium transfer surface, an apparatus for detecting defects on the transfer surface is provided. The apparatus includes a scanner mechanism adapted and constructed to generate signals corresponding to a condition of the transfer surface. A processor is also provided. The processor is operatively connected to the scanner mechanism, and is adapted and constructed to receive and interpret signals from the scanner mechanism. In an imaging system including at least one imaging medium transfer surface, a method of detecting defects on an image medium surface is provided. The method includes the following steps. First, a scanning mechanism is provided. The scanning mechanism is adapted and constructed to generate signals corresponding to a condition of the transfer surface within the imaging system. Next, a defect is detected on the transfer surface by analyzing the signals generated by the scanning mechanism.

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Meridian, ID, United States of America

Suzie Dustin