Shimadzu Corporation

Other

Susumu Adachi

Toshinori Yoshimuta

Kenji Sato

Satoshi Tokuda

Koichi Tanabe

Shoichi Okamura

Shinya Hirasawa

Takuro Izumi

Tetsuya Yoneda

Keiichi Fujii

Motosada Kiri

Akihiro Nishimura

Shigeya Asai

Shinji Miyauchi

Yasukuni Yamane

Shiro Oikawa

Masayuki Kamegawa

Masatomo Kaino

Takayuki Takemoto

Takashi Omori

Asaka Kohiyama

Hiroshi Koyama

A spectroscopic element and a detector are disposed along a circumference of one Rowland circle. The spectroscopic element has a spectral surface whose length, measured along the Rowland circle, is shorter than a length in the Rowland circle plane, of an irradiation surface irradiated with excitation beams emitted to a sample holder. The spectroscopic element and the sample holder are disposed to separate a group of characteristic X-rays within a common spectral range of the spectroscopic element.

X-ray spectroscopic analysis apparatus and elemental analysis method

A dispersive element is provided with a dispersive crystal for spectrally dispersing X-rays, a first support layer supporting the dispersive crystal, and a second support layer supporting the first support layer. The first support layer is greater in a thermal expansion coefficient than the dispersive crystal. The second support layer is smaller in a thermal expansion coefficient than the first support layer and is greater in rigidity than the first support layer.

Dispersive element

A chemical state analysis apparatusincludes: an excitation sourceconfigured to irradiate an irradiation region A of a predetermined surface in a sample S containing a battery material with an excitation rays for generating characteristic X-rays of the battery material; an analyzing crystalof a flat plate arranged so as to face the irradiation region A; a slitarranged between the irradiation region A and the analyzing crystal, the slit being arranged in parallel to the irradiation region A and a predetermined crystal plane of the analyzing crystal; an X-ray linear sensorin which linear detecting elementseach having a length in a direction parallel to the slitare arranged in a direction perpendicular to the slit; a wavelength spectrum generation unitconfigured to generate a wavelength spectrum based on intensity of the characteristic X-rays detected by the X-ray linear sensor; a peak wavelength determination unitconfigured to determine a peak wavelength which is a wavelength in a peak of the wavelength spectrum; and a chemical state specification unitconfigured to specify a value for specifying a chemical state of the battery material in the sample S from the peak wavelength determined by the peak wavelength determination unitand a standard curve representing a relation between a value representing the chemical state and the peak wavelength.

Apparatus and method for analyzing chemical state of battery material

An X-ray spectrometer includes: an excitation source that irradiates a predetermined irradiation region on a surface of a sample with an excitation ray generating a characteristic X-ray; a flat plate analyzing crystal facing the irradiation region; a slit provided between the irradiation region and the analyzing crystal, the slit being parallel to a predetermined crystal plane of the analyzing crystal; a linear sensor including linear detection elements having a length in a direction parallel to the slit are arranged in a direction perpendicular to the slit; and an energy calibration unit that measures two characteristic X-rays in which energy is known by irradiating a surface of a standard sample generating the two characteristic X-rays with the excitation ray from the excitation source, and calibrates the energy of the characteristic X-ray detected by each detection element of the X-ray linear sensor based on the measured energies of the two characteristic X-rays.

X-ray spectrometer and chemical state analysis method using the same

According to the method of manufacturing an optical matrix device of this invention, semiconductor films and gate insulating films which influence the characteristics of thin-film transistors most are formed in a vacuum (S, S), whereby the interfaces between the semiconductor films and gate insulating films are not contaminated. The semiconductor films and gate insulating films are formed in a vacuum, but wires need not be formed in a vacuum (S). Thus, the semiconductor films and gate insulating films formed in a vacuum are transferred onto the wires formed beforehand (S). Even if a substrate has a large area, the wires, semiconductor films and gate insulating films of the thin-film transistors can be formed efficiently.

Method of manufacturing an optical matrix device

According to a radiographic apparatus of this invention, an image correcting unit corrects offset for every pixel relative to a detection value outputted from a radiation detector having pixels for detecting radiation arranged in a two-dimensional array. In addition, the image correcting unit corrects the offset while holding noise components contained in the detection value. Thus, upon quantitative evaluation of the noises contained in the detection values outputted from the radiation detector, the noises of not only positive values but also negative values can be considered. Consequently, accurate evaluation may be achieved.

Radiographic apparatus

At least part of a readout pattern including carrier collecting electrodes, capacitors, thin-film transistors, data lines and gate lines is formed by vapor deposition or printing. This is formed separately from a semiconductor thick film. The semiconductor thick film and readout pattern constitute a flat panel X-ray detector (FPD) is mounted in a case to form a unit. A weight reduction is achieved by using the semiconductor thick film in place of a conventional glass substrate. The FPD manufactured in this way is free from great restrictions in time of transport and use.

Light or radiation detecting unit manufacturing method, and a light or radiation detecting unit manufactured by this method

A light or radiation image pickup apparatus comprises a first arithmetic unitfor calculating a first arithmetic value by subtracting a first offset signal from a main signal, a second arithmetic unitfor calculating a second arithmetic value which is a difference between a second offset signal and the first offset signal, and a correcting unitfor correcting the first arithmetic value calculated by the first arithmetic unit, by using the second arithmetic value calculated by the second arithmetic unitand corresponding to a period of the same length as a period from the first offset signal to the main signal used in the operation in the first arithmetic unit. The first arithmetic value is corrected to remove noise components due to leakage of charge signals accumulated during the period from the first offset signal to the main signal. It is thus possible to reduce deterioration of image quality due to leaks of charge signals accumulated in X-ray detecting elements(leakage currents) and prevent an extended imaging time.

Light or radiation image pickup apparatus

An FPD controller controls a flat panel X-ray detector (FPD) to perform a reading operation for reading carriers (charge information) and a reset operation for resetting and discarding the carriers, during a frame cycle from a reading point of time for reading charge information collectively from a predetermined read area (i.e. an in-field of 2,048&#xd7;2,048 pixels) to a reading point of time for reading charge information collectively from a next predetermined read area. This control can reduce the influence of the preceding predetermined read area.

Image sensor, and imaging apparatus using the same

A radiographic apparatus obtains lag-free radiation detection signals with lag-behind parts removed from radiation detection signals taken from a flat panel X-ray detector as X rays are emitted from an X-ray tube. The lag-behind parts are removed by a recursive computation on an assumption that the lag-behind part included in each X-ray detection signal is due to an impulse response formed of exponential functions, N in number, with different attenuation time constants. X-ray images are created from the lag-free radiation detection signals.

Radiographic apparatus that removes time lag by recursive computation

A radiographic apparatus removes lag-behind parts from radiation detection signals taken from an FPD as X rays are emitted from an X-ray tube, on an assumption that the lag-behind part included in each X-ray detection signal is due to an impulse response formed of a plurality of exponential functions with different attenuation time constants. When a single attenuation time constant and intensity are provisionally set, checking is made whether an attenuation to a noise level of X-ray detection signals occurs in an X-ray non-emission state following an X-ray emission state. When the set attenuation time constant and intensity are found appropriate (OK), the impulse response having the single exponential function is determined valid. Corrected radiation detection signals are obtained by removing the lag-behind parts using the impulse response determined.

Radiographic apparatus and radiation detection signal processing method

In the radiographic apparatus according to this invention, when a radiographic mode designatordesignates a non-standard radiographic mode, a signal correctoruses defect information stored in one of non-standard image defect information memoriesB&#x2013;E for correcting X-ray detection signals outputted from an FPDSince the pixel defect information for non-standard X-ray images is acquired by a pixel defect information converterthrough a conversion from defect information for standard X-ray images stored in a standard image defect information memoryA, it is unnecessary to collect output signals for pixel defect information acquisition from the FPDall over again. As a result, abnormal X-ray detection signals due to defects of radiation detecting elements may be corrected promptly, regardless of how the radiation detecting elements are assigned to the pixels in the X-ray images.

Radiographic apparatus, and radiation detection signal processing method

An apparatus using a two-dimensional radiation sensor for acquiring X-ray penetration images or the like. A monitoring radiography is performed with a small dose before a production radiography. A radiographic condition for the production radiography, specifically a radiation emitting period or a tube current of a radiation generator, is computed based on a ratio between a quantity of charges in a region of interest collected from the two-dimensional radiation sensor in time of the monitoring radiography and a desired quantity of charges in the region of interest in time of the production radiography. The production radiography is carried out based on a result of the computation to acquire a high quality image.

An apparatus for processing a two-dimensional image obtained by scanning sensor arrays of image detectors perpendicular thereto, the apparatus including an image memory for storing pixel data output by the image detector as a two-dimensional image, a first read-out unit for reading the stored pixel data about a particular detector in a particular array, a second read-out unit for reading pixel data in the neighborhood of the pixel data read by the first read-out unit, a first arithmetic unit for measuring the magnitude of difference in sensitivity between the detector whose pixel data is read by the first read-out unit and the detector whose pixel data is read by the second read-out unit, and a second arithmetic unit for compensating for the deficiency of sensitivity on the basis of the output of the first arithmetic unit.

Growing community of inventors

Kyoto, Japan

Susumu Adachi