Renesas Electronics Corporation

Japan Tobacco Inc.

Rodel Holdings, Inc.

Susumu Abe

Keiichi Suzuki

Kenji Takenouchi

Satoshi Taguchi

Yoichi Maeda

Manabu Nishimura

Yoshitaka Taki

Hajime Shimamoto

Katsumi Kondo

Shoji Ichikawa

Method of manufacturing a cut stem with increased filling capacity comprises tearing a rod-like stem material having a water content of 20 to 50% by weight, shredding the torn rod-like stem material, and subjecting the rod-like cut stem material to expansion treatment.

Method of manufacturing cut stem, cut stem manufacturing apparatus, and cut stem

A semiconductor device includes a first circuit and a plurality of pattern generators connected to the first circuit and each supplying a test pattern to the first circuit. A pattern-generator control circuit controls each of the plurality of pattern generators such that the pattern generator starts to operate when a control signal is at a first level and the pattern generator stops operating when the control signal is not at the first level. A pattern compressor compresses a result output from the first circuit in response to supply of the test patterns from the plurality of pattern generators. A pattern-compressor control circuit controls the pattern compressor. A self-diagnosis control circuit is connected to the pattern-generator control circuit and the pattern-compressor control circuit and controls the pattern-generator control circuit such that stop timings of the test patterns differ from one another among the plurality of pattern generators due to changing the control signals to selectively stop the pattern generators in a predetermined manner.

Semiconductor device

To reduce pseudo errors. A stationary signal is propagated through the circuit to be checked. A combination is extracted in which different asynchronous transfers occur between a transmitting side register and a receiving side register. From the extracted combination of asynchronous transfers, a circuit to be checked is extracted, and a synchronization circuit of a plurality of signals is excluded from the circuit to be checked. A stationary signal is propagated through the circuit to be checked, for each combination among all combinations of logic values '1' and '0' of the stationary signal. It is checked whether or not there exists one asynchronous transmitting side register to which signal change can logically reach, in the combination of logic values of the stationary signal propagated. Based on the result, it is determined whether or not the circuit is appropriate as a synchronization circuit for a single-signal transfer, thereby reducing pseudo errors.

Clock domain check method, clock domain check program, and recording medium

To reduce pseudo errors, a stationary signal is propagated through the circuit to be checked. A combination is extracted in which different asynchronous transfers occur between a transmitting side register and a receiving side register. From the extracted combination of asynchronous transfers, a circuit to be checked is extracted, and a synchronization circuit of a plurality of signals is excluded from the circuit to be checked. A stationary signal is propagated through the circuit to be checked, for each combination among all combinations of logic values '1' and '0' of the stationary signal. It is checked whether or not there exists one asynchronous transmitting side register to which signal change can logically reach, in the combination of logic values of the stationary signal propagated. Based on the result, it is determined whether or not the circuit is appropriate as a synchronization circuit for a single-signal transfer, thereby reducing pseudo errors.

A polishing compound containing cocoon-shaped silica particles and crystal silica particles, and water-soluble polymers including; at least one type selected from the groups including ammonium nitrate and ammonium acetate, and at least one type selected from methylcellulose, carboxymethylcellulose, hydroxyethylcellulose, and the group including carboxymethylcellulose.

Growing community of inventors

Tokyo, Japan

Susumu Abe