Spin Memory, Inc.

Integrated Silicon Solution, (cayman) Inc.

Susmita Karmakar

Neal Berger

Benjamin S Louie

Kuk-Hwan Kim

TaeJin Pyon

Mourad El Baraji

A memory device for storing data comprises a memory bank comprising a plurality of addressable memory cells, wherein the memory bank is divided into a plurality of segments. The memory device also comprises a cache memory operable for storing a second plurality of data words, wherein further each data word of the second plurality of data words is either awaiting write verification or is to be re-written into the memory bank. The cache memory is divided into a plurality of primary segments, wherein each primary segment of the cache memory is direct mapped to a corresponding segment of the plurality of segments of the memory bank, wherein each primary segment of the plurality of primary segments of the cache memory is sub-divided into a plurality of secondary segments, and each of the plurality of secondary segments comprises at least one counter for tracking a number of valid entries stored therein.

Error cache system with coarse and fine segments for power optimization

A memory device comprises a memory bank comprising a plurality of addressable memory cells, wherein the memory bank is divided into a plurality of segments. Further, the device comprises a cache memory operable for storing a second plurality of data words, wherein each data word of the second plurality of data words is either awaiting write verification associated with the memory bank or is to be re-written into the memory bank. The cache memory is divided into a plurality of primary segments, wherein each primary segment of the cache memory is direct mapped to a corresponding segment of the plurality of segments, wherein each primary segment is sub-divided into a plurality of secondary segments, and wherein each of the plurality of secondary segments comprises at least one counter for tracking a number of entries stored therein.

Heuristics for selecting subsegments for entry in and entry out operations in an error cache system with coarse and fine grain segments

A clocked driver circuit can include a level shifter latch and a driver. The level shifter latch can be configured to receive an input signal upon a clock signal and generate a level shifted output signal. The driver can be configured to receive the level shifted output signal from the level shifter and drive the output signal on a line. The signal levels of the output signal can be greater than the signal level of the input signal.

Word line decoder memory architecture

A method of writing data into a memory device comprising utilizing a pipeline to process write operations of a first plurality of data words addressed to a plurality of memory banks, wherein each of the plurality of memory banks is associated with a counter. The method also comprises writing a second plurality of data words and associated memory addresses into an error buffer, wherein the error buffer is associated with the plurality of memory banks and wherein further each data word of the second plurality of data words is either awaiting write verification associated with a bank from the plurality of memory banks or is to be re-written into a bank from the plurality of memory banks. Further, the method comprises maintaining a count in each of the plurality of counters for a respective number of entries in the error buffer corresponding to a respective memory bank.

Determining an inactive memory bank during an idle memory cycle to prevent error cache overflow

A device includes an array of memory cells, input/output lines coupled to the memory cells, and sense amplifiers coupled to the input/output lines. Each sense amplifier is associated with a respective input/output line. The device also includes trim circuits. Each trim circuit is associated with and coupled to a respective sense amplifier. Each sense amplifier receives a respective reference voltage that allows the sense amplifier to sense a bit value of an addressed memory cell. Each trim circuit is operable for compensating for variations in the reference voltage used by the respective sense amplifier.

Memory array with individually trimmable sense amplifiers

A clocked driver circuit can include a master-slave level shifter latch and a driver. The master-slave level shifter latch can be configured to receive an input signal upon a first state of a clock signal, latch the input signal upon a second state of the clock signal and generate a level shifted output signal corresponding to the latched input signal. The driver can be configured to receive the level shifted output signal from the master-slave level shifter and drive the output signal on a line. The signal levels of the output signal can be greater than the signal level of the input signal.

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Fremont, CA, United States of America

Susmita Karmakar