The Medical College of Wisconsin, Inc.

General Electric Company

Suryanarayanan Sivaran Kaushik

Kevin Matthew Koch

Described here are systems and methods for using a magnetic resonance imaging ('MRI') system to estimate parameters of spectral profiles contained in multispectral data acquired using multispectral imaging ('MSI') techniques, such as MAVRIC. These spectral profile parameters are reliably extracted using an iterative perturbation theory technique and utilized in a number of different applications, including fat suppression, artifact correction, and providing accelerated data acquisitions.

Voxelwise spectral profile modeling for use in multispectral magnetic resonance imaging

A method for correcting one or more artifacts within a multi-spectral magnetic resonance image is provided. The method includes acquiring a plurality of spectral bins each including a plurality of voxels and corresponding to a different frequency of MR signals emitted by an imaged object. The plurality of voxels of each spectral bin correspond to the frequency of the spectral bin so as to define a spatial coverage of the spectral bin. The method further includes expanding each spectral bin by increasing the spatial coverage of the spectral bin, and generating the multi-spectral magnetic resonance image based at least in part on the expanded spectral bins.

System and method for correcting one or more artifacts within a multi-spectral magnetic resonance image

Systems and methods are provided for performing a calibration 'pre-scan' prior to acquiring data using a magnetic resonance imaging ('MRI') system performing a multi-spectral imaging (&#x201c;MSI&#x201d;) acquisition. Information from the calibration scan is used to optimize the scanning and data collection during the MSI scan. As a result, scan times and motion artifacts are reduced. In addition, image resolution can also be increased, thereby improving image quality. As one example, the MSI acquisition can be a MAVRIC acquisition. In general, the calibration data is used to determine the minimum number of spectral bins required to achieve acceptable image quality near a specific metallic implant or device.

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Waukesha, WI, United States of America

Suryanarayanan Sivaran Kaushik