Growing community of inventors

Clifton Park, NY, United States of America

Suresh Uppal

Average Co-Inventor Count = 2.67

ph-index = 3

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 426

Suresh UppalWilliam McMahon (5 patents)Suresh UppalAndreas Kerber (4 patents)Suresh UppalAkhilesh Gautam (3 patents)Suresh UppalMin-Hwa Chi (2 patents)Suresh UppalEduard Albert Cartier (1 patent)Suresh UppalShahab Siddiqui (1 patent)Suresh UppalManjunatha Govinda Prabhu (1 patent)Suresh UppalRandy W Mann (1 patent)Suresh UppalAnil Kumar (1 patent)Suresh UppalGeetha Aluri (1 patent)Suresh UppalSalvatore Cimino (1 patent)Suresh UppalBeth Baumert (1 patent)Suresh UppalArnaud Bousquet (1 patent)Suresh UppalAbu Naser Zainuddin (1 patent)Suresh UppalHao Jiang (1 patent)Suresh UppalSuresh Uppal (12 patents)William McMahonWilliam McMahon (13 patents)Andreas KerberAndreas Kerber (9 patents)Akhilesh GautamAkhilesh Gautam (8 patents)Min-Hwa ChiMin-Hwa Chi (121 patents)Eduard Albert CartierEduard Albert Cartier (101 patents)Shahab SiddiquiShahab Siddiqui (52 patents)Manjunatha Govinda PrabhuManjunatha Govinda Prabhu (38 patents)Randy W MannRandy W Mann (32 patents)Anil KumarAnil Kumar (12 patents)Geetha AluriGeetha Aluri (6 patents)Salvatore CiminoSalvatore Cimino (6 patents)Beth BaumertBeth Baumert (3 patents)Arnaud BousquetArnaud Bousquet (1 patent)Abu Naser ZainuddinAbu Naser Zainuddin (1 patent)Hao JiangHao Jiang (1 patent)
..
Inventor’s number of patents
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Strength of working relationships

Company Filing History:

1. Globalfoundries Inc. (12 from 5,671 patents)

2. International Business Machines Corporation (1 from 164,108 patents)


12 patents:

1. 10181713 - Methods of post-process dispensation of plasma induced damage protection component

2. 10147496 - OTPROM for post-process programming using selective breakdown

3. 10106892 - Thermal oxide equivalent low temperature ALD oxide for dual purpose gate oxide and method for producing the same

4. 10054630 - Methods, apparatus and system for screening process splits for technology development

5. 10012687 - Methods, apparatus and system for TDDB testing

6. 9916903 - OTPROM for post-process programming using selective breakdown

7. 9702926 - Methods, apparatus and system for screening process splits for technology development

8. 9599656 - Methods, apparatus and system for voltage ramp testing

9. 9500703 - Semiconductor structure having test device

10. 9460806 - Method for creating an OTPROM array possessing multi-bit capacity with TDDB stress reliability mechanism

11. 9372226 - Wafer test structures and methods of providing wafer test structures

12. 9324822 - Gate dielectric protection for transistors

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12/3/2025
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