Eyoto Group Limited

Suraj Sudera

Thomas Drew

Michal Krawczynski

Joseph Davies

Jonathan Dean

Omkar Joshi

A test pattern () comprising a set of dots () which define a first ellipse () of best fit in which the major and minor axes R, Rare equal (i.e. a circle) is displayed on a plane surface and a digital image of the (usually distorted) test pattern seen through a lens is captured. A second ellipse of best fit joining the dots in the set is derived from the distorted test pattern in the image. Characteristics of the first and second ellipses are compared to determine the degree and nature of distortion to the test pattern, from which the power of the lens is calculated. The major and minor axes of the first and second ellipses may be compared. The test pattern can include a number of said sets of dots distributed over an area of the surface with each set being analysed to determine the optical parameters of the lens at multiple locations.

Growing community of inventors

Birmingham, United Kingdom

Suraj Sudera