Samsung Electronics Co., Ltd.

Samsung Display Co., Ltd.

Sunil Shim

Jaehoon Jang

Hansoo Kim

Wonseok Cho

Jaehun Jeong

Kihyun Kim

Sunghoi Hur

Woonkyung Lee

Jinho Kim

Su-Youn Yi

Juyoung Lim

Younggoan Jang

Byoungkeun Son

Jongsoo Kim

Byeong-In Choe

HuiChang Moon

Ju-Young Lim

Kwanyong Kim

Jang-Gn Yun

Jinman Han

Jungdal Choi

Donghyuk Chae

Jae-Joo Shim

Youngho Lim

Sang-Wan Nam

Changhyun Lee

Jin-Sung Lee

Kihyun Hwang

Kwang Soo Seol

Won-Taeck Jung

Younghwan Son

Jaeyoung Ahn

Hoosung Cho

Jinsoo Lim

Jin-Soo Lim

Sukhun Choi

Juyul Lee

Seogoo Kang

Jaehyoung Choi

Doogon Kim

Suhyeong Lee

Sung-Hwan Jang

Sanghoon Jeong

Hyojoon Ryu

Jesuk Moon

Jongsik Chun

Jin-Yong Oh

Wookhyoung Lee

Youngsoo An

Mingu Kim

Jeehon Han

Jeonghyuk Choi

Dongwoo Kim

Joon-Sung Lim

Jeehoon Han

Jae Ho Kim

Jae-Hoon Jang

Jaeduk Lee

Kyunghyun Kim

Shinhwan Kang

Sungmin Hwang

Haemin Lee

Jin-Kyu Kang

Sangjun Hong

Suyoun Lee

Jaeshin Lee

Hyun-Sil Oh

Jin-Man Han

Taisoo Lim

Gilsung Lee

Sohyeon Lee

Euido Kim

Sungmi Hwang

Changsup Mun

Chulmin Park

Hye-Young Kwon

A semiconductor device includes; a memory stack disposed on a substrate and including a lower gate electrode, an upper gate stack including a string selection line, a vertically extending memory gate contact disposed on the lower gate electrode, and a vertically extending selection line stud disposed on the string selection line. The string selection line includes a material different from that of the lower gate electrode, and the selection line stud includes a material different from that of the memory gate contact.

Semiconductor device having selection line stud connected to string selection line

A vertical memory device including: a circuit pattern on a first substrate; an insulating interlayer on the first substrate, the insulating interlayer covering the circuit pattern; a bending prevention layer on the insulating interlayer, the bending prevention layer extending in a first direction substantially parallel to an upper surface of the first substrate; a second substrate on the bending prevention layer; gate electrodes spaced apart from each other in a second direction on the second substrate, the second direction being substantially perpendicular to the upper surface of the first substrate; and a channel extending through the gate electrodes in the second direction.

Vertical memory devices including insulating interlayer covering circuit pattern and intermediate insulation layer on the insulating interlayer

A semiconductor device includes a structure including a stack structure including a first stack structure and a second stack structure on the first stack structure; a memory vertical structure penetrating the structure; a support vertical structure including a portion penetrating the structure and including an air gap; and a peripheral contact plug, wherein the first and second stack structures includes interlayer insulating layers and gate layers alternately stacked, a side of the memory vertical structure includes a slope changing portion, the peripheral contact plug includes an upper region disposed on a level higher than an upper surface of an uppermost gate layer, the upper region of the peripheral contact plug includes a first region, a second region and a connection region between the first and second regions, and the connection region has a slope different from a slope of at least one of the first and second regions.

Semiconductor device and a data storage system including the same

Disclosed is a three-dimensional semiconductor device including a horizontal semiconductor layer including a plurality of well regions having a first conductivity and a separation impurity region having a second conductivity, and a plurality of cell array structures provided on the well regions of the horizontal semiconductor layer, respectively. The separation impurity region is between and in contact with the well regions. Each of the cell array structures comprises a stack structure including a plurality of stacked electrodes in a vertical direction to a top surface of the horizontal semiconductor layer, and a plurality of vertical structures penetrating the stack structure and connected to a corresponding well region.

Three-dimensional semiconductor device

A semiconductor device including: a memory cell array region and a staircase region on a pattern structure; a stack structure including insulating layers and gate layers with gate pads alternately stacked in a vertical direction; a separation structure penetrating through the stack structure and contacting the pattern structure; a memory vertical structure penetrating through the stack structure and contacting the pattern structure; a support vertical structure penetrating through the stack structure and contacting the pattern structure; gate contact plugs disposed on the gate pads; and a peripheral contact plug spaced apart from the gate layers, wherein an upper surface of the memory vertical structure is at a first level, an upper surface of the peripheral contact plug is at a second level, an upper surface of the separation structure is at a third level, and upper surfaces of the gate contact plugs are at a fourth level.

An integrated circuit device includes a plurality of word lines, a string selection line structure stacked on the plurality of word lines, and a plurality of channel structures extending in a vertical direction through the plurality of word lines and the string selection line structure. The string selection line structure includes a string selection bent line including a lower horizontal extension portion extending in a horizontal direction at a first level higher than the plurality of word lines, an upper horizontal extension portion extending in the horizontal direction at a second level higher than the first level, and a vertical extension portion connected between the lower horizontal extension portion and the upper horizontal extension portion.

Integrated circuit device including vertical memory

A three-dimensional semiconductor memory device includes a substrate including a cell array region and a connection region, an electrode structure including electrodes vertically stacked on the substrate, the electrodes including pad portions on the connection region, respectively, and the pad portions of the electrodes being stacked in a staircase structure, first vertical structures penetrating the electrode structure on the cell array region, and second vertical structures penetrating the electrode structure on the connection region, each of the second vertical structures including first parts spaced apart from each other in a first direction, and at least one second part connecting the first parts to each other, the at least one second part penetrating sidewalls of the pad portions, respectively.

Three-dimensional semiconductor memory device with vertical structures between contact plugs

An integrated circuit device comprising a base structure, a gate stack on the base structure and comprising a plurality of gate electrodes spaced apart from each other, a first upper insulating layer on the gate stack, a plurality of channel structures that penetrate the gate stack, each of the plurality of channel structures comprises a respective alignment key protruding from the gate stack, a second upper insulating layer that overlaps the respective alignment key of each of the plurality of channel structures, a top supporting layer on the second upper insulating layer, a bit line on the top supporting layer, and a plurality of bit line contacts that electrically connect respective ones of the plurality of channel structures to the bit line. A sidewall of the first upper insulating layer includes a first step.

Integrated circuit device and electronic system including the same

A vertical memory device includes a gate electrode structure on a substrate, a channel extending through the gate electrode structure, and an etch stop layer on a sidewall of the gate electrode structure. The gate electrode structure includes gate electrodes spaced apart from each other in a first direction and stacked in a staircase shape. The channel includes a first portion and a second portion contacting the first portion. A lower surface of the second portion has a width less than a width of an upper surface of the first portion. The etch stop layer contacts at least one gate electrode of the gate electrodes, and overlaps an upper portion of the first portion of the channel in a horizontal direction. The at least one gate electrode contacting the etch stop layer is a dummy gate electrode including an insulating material.

Semiconductor device and electronic system including the same

A semiconductor device includes gate layers stacked on a substrate in a first direction perpendicular to an upper surface of the substrate, and channel structures penetrating the gate layers and extending in the first direction, each of the channel structures includes first dielectric layers on side surfaces of the gate layers, respectively, and spaced apart from each other in the first direction, electric charge storage layers on side surfaces of the first dielectric layers, respectively, and spaced apart from each other in the first direction, a second dielectric layer extending perpendicularly to the substrate to conform to side surfaces of the electric change storage layers, and a channel layer extending perpendicularly, and each of the first dielectric layers has a first maximum length, and each of the electric charge storage layers has a second maximum length greater than the first maximum length in the first direction.

Vertical memory devices with segmented charge storage layers

A vertical memory device includes a channel extending vertically on a substrate. A charge storage structure is disposed on a sidewall of the channel. Gate electrodes are spaced apart from each other vertically and surround the charge storage structure. A first insulation pattern includes an air gap between the gate electrodes. The charge storage structure includes a tunnel insulation layer, a charge trapping pattern, and a first blocking pattern sequentially stacked horizontally. The charge storage structure includes charge trapping patterns spaced apart from each other vertically. Each of the charge trapping patterns faces one of the gate electrodes horizontally. A length in the first direction of an outer sidewall of each of the charge trapping patterns facing the first blocking pattern is less than that of an inner sidewall thereof facing the tunnel insulation layer.

Vertical memory devices including charge trapping patterns with improved retention characteristics

A semiconductor memory device includes a stack structure comprising horizontal electrodes sequentially stacked on a substrate including a cell array region and an extension region and horizontal insulating layers between the horizontal electrodes. The semiconductor memory device may further include vertical structures that penetrate the stack structure, a first one of the vertical structures being on the cell array region and a second one of the vertical structures being on the extension region. Each of the vertical structures includes a channel layer, and a tunneling insulating layer, a charge storage layer and a blocking insulating layer which are sequentially stacked on a sidewall of the channel layer. The charge storage layer of the first vertical structure includes charge storage patterns spaced apart from each other in a direction perpendicular to a top surface of the substrate with the horizontal insulating layers interposed therebetween. The charge storage layer of the second vertical structure extends along sidewalls of the horizontal electrodes and sidewalls of the horizontal insulating layers.

Semiconductor memory device and method of manufacturing the same

Vertical memory devices with bending prevention layers

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Seoul, South Korea

Sunil Shim