Photon Dynamics, Inc.

Sunil S Sawkar

William K Pratt

Reza Safaee-Rad

Jeffrey A Hawthorne

Ray Leerentveld

Aleksander Crnatovic

A method for inspecting a display panel includes capturing images of a portion of a plurality of display panels having display elements with an image acquisition device having sensor elements, each image comprising an image of approximately a first number of display elements captured with approximately a second number of sensor elements, the first number different from the second number, each image including a Moir&#xe9; artifact pattern, combining the images of the portion of the plurality of display panels to form a reference image including a Moir&#xe9; artifact pattern reference, capturing a sample image of a portion of a sample display panel having display elements with the image acquisition device, the sample image comprising an image of approximately the first number of display elements on the sample display captured with approximately the second number of sensor elements, the sample image including a sample Moir&#xe9; artifact pattern, combining the sample image with the reference image to inhibit the sample Moir&#xe9; artifact pattern from the sample image, and to form a test image, determining defects in display elements in the portion of the sample display panel by inspecting the test image, and determining whether to reject the sample display panel in response to the defects in the display elements.

Moir&#xe9; suppression method and apparatus

A method for locating blobs in an image, includes the steps of: forming a blob reference mask from the image, the blob reference mask including a portion indicating a portion of the image containing a first blob, if any, and forming a reference image from the image, the reference image corresponding to the image. The method also includes the steps of forming a modified image from the image by replacing the portion of the image containing the first blob, if any, with a portion of the reference image corresponding to the portion of the image, and locating a second blob in the image in response to the modified image.

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Fremont, CA, United States of America

Sunil S Sawkar