Kabushiki Kaisha Toshiba

Sunil Konanki

Atsushi Kameyama

Michael H Sitko

Systems and methods for the noise analysis of circuits are presented. These systems and methods may allow a circuit or circuit design to be analyzed for possible noise failures in a block of logic caused by sources. outside the block. More particularly, these systems and methods may generate an abstract file for one or more blocks of a circuit. These abstract files may include noise tolerances for input pins and bi-directional pins of a block, along with noise tolerances for those output pins of the block which also feed to an input of one or more gates internal to the block. Using these noise abstracts a unit of the circuit may be analyzed, or the circuit itself may be analyzed for possible noise induced failures.

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Austin, TX, United States of America

Sunil Konanki