Broadcom Corporation

Sunil Kanekal

John S Walley

Evan S McCarthy

Jared Welz

Amir Ibrahim

Jeon Hyun-Gyu

Hyun-Gyu Jeon

Disclosed are various embodiments involving correction of signals generated by a crystal oscillator. An age of an integrated circuit or a time of use of the integrated circuit may be determined. A signal generated from a crystal of the integrated circuit may be modified based at least in part on the determined age of the integrated circuit or the determined time of use of the integrated circuit.

Method and system for signal generation via a temperature sensing crystal integrated circuit

Aspects of the invention may comprise an integrated circuit comprising a memory, a temperature sensor, a crystal, and a communication module. Data stored in the memory may indicate a frequency of the crystal as a function of temperature and/or time. The memory may be writable via the communication module. Data stored in the memory of the integrated circuit may be updated based on an age and/or time of use of the integrated circuit. The time of use may be one or both of: how long the crystal has been oscillating since its most-recent start up, and how long the crystal has been in use over its lifetime. An electronic device may calculate a frequency of an oscillating signal output by the crystal based on a temperature indication from the temperature sensor and data read from the memory of the integrated circuit.

Aspects of a method and system for signal generation via a temperature sensing crystal integrated circuit are provided. In this regard, a temperature sensing crystal integrated circuit (TSCIC) comprising a memory and a crystal or crystal oscillator may generate a signal indicative of a measured temperature. The generated signal and data stored in the memory may be utilized to configure one or more circuits communicatively coupled to the TSCIC. The data stored in the memory may characterize behavior of the TSCIC as a function of temperature and/or time. The data characterizing the behavior of the TSCIC may indicate variations in frequency of the crystal or crystal oscillator as a function of temperature and/or time. The data characterizing the behavior of the TSCIC may comprise one or both of a frequency value and a frequency correction value.

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San Jose, CA, United States of America

Sunil Kanekal