Changxin Memory Technologies, Inc.

Ghangxin Memory Technologies, Inc.

Sungsoo Chi

Ying Chu Wang

Fengqin Zhang

Shuyan Jin

WeiBing Shang

Guifen Yang

KangLing Ji

Hongwen Li

Jia Wang

Daoxun Wu

Liang Zhang

Kanyu Cao

Ying Wang

Weibing Shang

A memory is provided. The memory includes: a storage array that includes multiple bit lines, each of the multiple bit lines is connected to multiple storage cells in the storage array; multiple column select signal units that are connected to sensitive amplifiers, the sensitive amplifiers and the multiple bit lines are disposed in one-to-one correspondence; local data buses that are divided into local data buses O and local data buses E, adjacent bit lines are electrically connected to a respective local data bus O and a respective local data bus E, respectively, through a respective sensitive amplifier and a respective column select signal unit; and a first error checking and correcting unit and a second error checking and correcting unit that are configured to check and correct errors of data.

Memory with error checking and correcting unit

Embodiments of the present disclosure provide a word line driver, a word line driver array, and a semiconductor structure, relating to the technical field of semiconductors. The word line driver includes: a zeroth P-channel metal oxide semiconductor (PMOS) transistor, a zeroth N-channel metal oxide semiconductor (NMOS) transistor, and a first NMOS transistor, the zeroth PMOS transistor being provided with a gate connected to a gate of the first NMOS transistor and configured to receive a first control signal, a source configured to receive a second control signal, and a drain connected to a drain of the first NMOS transistor, the zeroth NMOS transistor being provided with a gate configured to receive a second control complementary signal, and a drain of the zeroth NMOS transistor and the drain of the first NMOS transistor being configured to be connected to a word line.

Word line driver, word line driver array, and semiconductor structure

A sense amplifier circuit architecture includes a first NMOS layout, a second NMOS layout, a first PMOS layout, a second PMOS layout, a first processing structure layout and a second processing structure layout. The first NMOS layout includes first N-type active layers and first gate layers discretely arranged on the first N-type active layers. The second NMOS layout includes second N-type active layers and second gate layers discretely arranged on the second N-type active layers. The first PMOS layout includes first P-type active layers and third gate layers discretely arranged on the first P-type active layers. The second PMOS layout includes second P-type active layers and fourth gate layers discretely arranged on the second P-type active layers. The first processing structure layout includes first active layers and a first isolation gate. The second processing structure layout includes second active layers and a second isolation gate.

Sense amplifier circuit architecture

A memory circuit at least includes a plurality of memory banks, where each of the memory banks includes a first memory sub-bank, a second memory sub-bank and a third memory sub-bank sequentially arranged, the second memory sub-bank including a first memory section and a second memory section, the first memory sub-bank and the second memory section being configured to store upper bytes, and the first memory section and the third memory sub-bank being configured to store lower bytes.

Memory circuit and memory

The present disclosure provides an electronic device and a driving method. The electronic device comprises: a sensitivity amplifier and a voltage adjustment circuit. The sensitivity amplifier includes: a first P-type transistor, a second P-type transistor, a first N-type transistor, a second N-type transistor, and a control circuit. The control circuit is connected to the third node, the fourth node, and a preset voltage terminal. A first control signal terminal responds to the signal of the first control signal terminal to connect the preset voltage terminal and the third node and the fourth node. The preset voltage terminal inputs a preset voltage signal. The electronic device write a preset voltage signal of a suitable size to the sensitivity amplifier through the voltage adjustment circuit, so that the sensitivity amplifier has an appropriate voltage difference between the bit line and the complementary bit line during offset elimination.

Electronic device and driving method thereof

A sense amplifier includes an amplifying circuit and a voltage equalizing circuit. The amplifying circuit includes: a first P-type transistor, having a first terminal connected to a third node, a second terminal connected to a first node, and a gate connected to a first bit line; a second P-type transistor, having a first terminal connected to the third node, a second terminal connected to a second node, and a gate connected to a second bit line; a first N-type transistor, having a first terminal connected to the first node, a second terminal connected to a fourth node, and a gate connected to the first bit line; a second N-type transistor, having a first terminal connected to the second node, a second terminal connected to the fourth node, a gate connected to the second bit line. The voltage equalizing circuit is connected between the first node and the second node.

Sense amplifier, method for driving sense amplifier, and memory

A readout circuit structure is provided, which includes: a first sense amplification circuit and a second sense amplification circuit, disposed adjacent to each other along an extension direction of a bit line, here the first sense amplification circuit is coupled to one memory array in the adjacent memory arrays by a first bit line, and is coupled to the other memory array by a first complementary bit line, and the second sense amplification circuit is coupled to one memory array in the adjacent memory arrays by a second bit line, and is coupled to the other memory array by a second complementary bit line; a first equalization pipe, connected to the first bit line; a second equalization pipe, connected to the first complementary bit line; a third equalization pipe, connected to the second bit line; and a fourth equalization pipe, connected to the second complementary bit line.

Readout circuit structure

Embodiments relate to a sense amplifier circuit and a data read method. The sense amplifier circuit includes: a first P-type transistor connected to a first signal terminal; a second P-type transistor connected to a second signal terminal; a first N-type transistor connected to a third signal terminal; a second N-type transistor connected to a fourth signal terminal; a first offset cancellation subcircuit configured to connect a first read bit line to a second complementary read bit line in response to a first offset cancellation signal; a second offset cancellation subcircuit configured to connect a first complementary read bit line to a second read bit line in response to a second offset cancellation signal; a first write-back subcircuit configured to connect the first complementary read bit line to the second complementary read bit line in response to a first write-back signal; and a second write-back subcircuit.

Sense amplifier circuit and data read method

A readout circuit architecture and a sense amplification circuit are provided. The readout circuit architecture includes: a readout amplification unit including a first P-type transistor and a second P-type transistor; and a first offset compensation unit including a first offset compensation transistor and a second offset compensation transistor. The first P-type transistor is arranged in a first area and the second P-type transistor is arranged in a second area. When the first area and the second area are arranged at interval in a first direction, the first offset compensation transistor and the second offset compensation transistor are arranged in a third area located between the first area and the second area. When the first area and the second area are arranged adjacently in the first direction, the first offset compensation transistor is arranged in a fourth area and the second offset compensation transistor is arranged in a fifth area.

Readout circuit layout and sense amplification circuit

A control circuit, a method for reading and writing and a memory are provided. The control circuit includes a pre-charge circuit, an amplification circuit and an equalization circuit. The pre-charge circuit is directly electrically connected to at least one of a bit line or a complementary bit line. The amplification circuit has a first node and a second node. The equalization circuit is connected between the first node and the bit line and between the second node and the complementary bit line.

Control circuit, method for reading and writing and memory

The present disclosure provides a sense amplification structure and a memory architecture. The sense amplification structure includes: a first PMOS transistor provided with a gate connected to a second readout bit line and a source connected to a first signal terminal; a first NMOS transistor provided with a gate connected to an initial bit line; a drain of the first PMOS transistor and a drain of the first NMOS transistor being connected to a first complementary readout bit line; a second PMOS transistor provided with a gate connected to the second complementary readout bit line; a second NMOS transistor provided with a gate connected to an initial complementary bit line and a source connected to a second signal terminal; a drain of the second PMOS transistor and a drain of the second NMOS transistor being connected to the first readout bit line.

Sense amplification structure and memory architecture

A column select signal cell circuit, a bit line sense circuit and a memory are disclosed. The column select signal cell circuit includes four column select cells, each of which includes 4*N input and output ports, 4*N bit line connection ports and one control port. The control ports of a first column select cell and a fourth column select cell are connected to a first column select signal, and the control ports of a second column select cell and a third column select cell are connected to a second column select signal. The bit line connection ports of the first column select cell and the third column select cell are connected to 8*N bit lines of a first storage unit group, the bit line connection ports of the second column select cell and the fourth column select cell are connected to 8*N bit lines of a second storage unit group.

Column select signal cell circuit, bit line sense circuit and memory

A word line driver circuit may at least include multiple word line drivers, each of which including a PMOS transistor and at least one NMOS transistor. The multiple word line drivers include multiple PMOS transistors and multiple NMOS transistors. The multiple PMOS transistors are arranged side by side, and in an arrangement direction of the multiple PMOS transistors, a part of the multiple NMOS transistors are located on a side of the multiple PMOS transistors, and another part of the NMOS transistors are located on another side of the multiple PMOS transistors.

Word line driver circuit and memory

The present disclosure provides a memory circuit and a memory. The memory circuit at least includes a plurality of memory blocks. Each of the memory blocks includes a first memory sub-block, a second memory sub-block, and a third memory sub-block arranged in sequence; the second memory sub-block includes a first memory unit and a second memory unit; the first memory sub-block and the first memory unit are configured to store high-order bytes; the second memory unit and the third memory sub-block are configured to store low-order bytes; and in an arrangement direction of memory sub-blocks, different memory units that are arranged side by side have different block selection addresses.

A memory is provided. The memory includes banks, each bank includes a U half bank and a V half bank; a first error checking and correcting unit connected with the U half banks and the V half banks and configured to check and correct errors of output data of the U half banks and the V half banks; and a second error checking and correcting unit connected with the U half banks and the V half banks and configured to check and correct errors of the output data of the U half banks and the V half banks.

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Hefei, China

Sungsoo Chi