Samsung Electronics Co., Ltd.

Sungkwan Kang

Nam-Kyu Kim

Byeongchan Lee

Keum Seok Park

Sangbom Kang

Jongwook Lee

Yonghoon Son

Yong-Hoon Son

Yugyun Shin

A semiconductor device has a silicide source/drain region is fabricated by growing silicon on an epitaxial region including silicon and either germanium or carbon. In the method, a gate electrode is formed on a semiconductor substrate with a gate insulating layer interposed therebetween. An epitaxial layer is formed in the semiconductor substrate at both sides of the gate electrodes. A silicon layer is formed to cap the epitaxial layer. The silicon layer and a metal material are reacted to form a silicide layer. In a PMOS, the epitaxial layer has a top surface and inclined side surfaces that are exposed above the upper surface of the active region. The silicon layer is grown on the epitaxial layer in such a way as to cap the top and inclined surfaces.

Semiconductor device including MOS transistor having silicided source/drain region and method of fabricating the same

Semiconductor devices including silicide regions and methods of fabricating the same

A semiconductor device includes a semiconductor substrate, a gate electrode structure including a gate electrode located on an active region of the semiconductor substrate, first and second epitaxial regions located in the active region at opposite sides of the gate electrode structure, and first and second silicide layers on upper surfaces of the first and second epitaxial regions, respectively. The first and second epitaxial regions include Si&#x2014;X, where X is one of germanium and carbon, and at least a portion of each of the first and second silicide layers is devoid of X and includes Si&#x2014;Y, where Y is a metal or metal alloy.

A method of fabricating a multilevel semiconductor integrated circuit is provided, comprising: forming on a first active semiconductor structure a first plurality of transistors with respective gate structures disposed on a first substrate and source or drain regions disposed within the first substrate; depositing a first insulation layer on the first substrate and the gate structures; etching the insulation layer to form a plurality of openings exposing portions of the first substrate contacting the bottoms of the openings; forming a semiconductor seed layer filling the openings; forming an amorphous layer on the seed layer and the insulation layer; subjecting the first active semiconductor structure to at least one application of laser irradiation to transform the amorphous layer to a crystalline semiconductor layer having a protrusion region with a peak at or near the middle of two adjacent openings; forming on a second active semiconductor structure a second plurality of transistors with respective gate structures disposed on the crystalline semiconductor layer and forming a contact structure to electrically connect a transistor of the first active semiconductor structure to a transistor of the second active semiconductor structure.

Multilevel semiconductor device and method of manufacturing the same

In some methods of fabricating a silicon-on-insulator substrate, a semiconductor substrate is provided that includes a single crystalline structure within at least a defined region thereof. A first insulating film is formed on the defined region of the semiconductor substrate with an opening that exposes a portion of the defined region of the semiconductor substrate having the single crystalline structure. A first non-single crystalline film is formed on the exposed portion of the semiconductor substrate and that at least substantially fills the opening in the first insulating film. A laser beam is generated that heats the first non-single crystalline film to change the first non-single crystalline film into a first single crystalline film having substantially the same single crystalline structure as the defined region of the semiconductor substrate.

Methods of fabricating silicon-on-insulator substrates having a laser-formed single crystalline film

A method of fabricating a semiconductor thin film is provided, comprising: forming an insulation layer on a semiconductor substrate; etching the insulation layer to form a plurality of openings exposing the substrate at the bottom of the openings; filling the openings with a semiconductor seed layer; forming an amorphous layer on the seed layer and the insulation layer; transforming the amorphous layer to a polycrystalline layer by exposing the amorphous layer to a first laser irradiation at a first energy level; and forming a single semiconductor crystalline film by annealing the polycrystalline layer and the semiconductor seed layer with a second laser irradiation at a second energy level.

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Seoul, South Korea

Sungkwan Kang