Samsung Electronics Co., Ltd.

Samsung Display Co., Ltd.

Sunggon Jung

Sangoh Park

Hungbae Ahn

Heesoo Yoo

Yujeong Sin

Daehyun Jung

A method of inspecting a semiconductor device, includes: scanning a plurality of first circuit pattern layers of the semiconductor device and generating a plurality of first images respectively corresponding the plurality of first circuit pattern layers of the semiconductor device; overlapping the plurality of first images with each other and counting a plurality of first defects in the overlapped first images; setting main inspection areas with priority orders by using position coordinates of the counted first defects; and storing the main inspection areas with the position coordinates of the counted first defects.

Method of inspecting semiconductor device

A method of manufacturing a photomask set includes: preparing a mask layout, the mask layout including a plurality of first layout patterns apart from one another in a first region, wherein distances between center points of three first layout patterns adjacent to one another from among the plurality of first layout patterns respectively have different values; grouping pairs of first layout patterns, in which a distance between two first layout patterns adjacent to each other does not have a smallest value, and splitting the mask layout pattern into at least two mask layouts; and forming a photomask set including at least two photomasks each including a mask pattern corresponding to the first layout pattern included in each of the mask layout patterns split into at least two mask layouts.

Method of manufacturing photomask set for forming patterns

Method of manufacturing photomask set for forming patterns, and method of manufacturing semiconductor device using the photomask set

A display module includes a display part and a bending part. The display part includes a display region for displaying an image and at least one bending guide line. The bending part bends the display part along a bending line which corresponds to the bending guide line, when the bending guide line is selected based on an input signal.

Display module and method of controlling same

Growing community of inventors

Suwon-si, South Korea

Sunggon Jung